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Patent Searching and Data


Title:
TEST SOCKET UNIT
Document Type and Number:
WIPO Patent Application WO/2017/171339
Kind Code:
A1
Abstract:
Disclosed is a test socket unit for electrically connecting a test object and a test circuit device. The test socket unit includes: a plurality of support locking pins configured to be stationarily installed on the surface of the test substrate; a socket main body configured to support a plurality of probes for signal transmission; a floating plate configured to include a pin guide hole in which the support locking pin is inserted; an elastic member configured to be interposed in between the socket main body and the floating plate; and at least one locking member configured to include a locking portion engaged with the locking engaging portion and prevented from separating upward by the locking stopper.

Inventors:
SON JANG-YOUL (KR)
Application Number:
KR2017/003292
Publication Date:
October 05, 2017
Filing Date:
March 28, 2017
Export Citation:
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Assignee:
LEENO IND INC (KR)
International Classes:
G01R1/04; G01R31/28
Foreign References:
KR20130123193A2013-11-12
KR20130071817A2013-07-01
KR19990064101A1999-07-26
JP2009036679A2009-02-19
JP2006286613A2006-10-19
Attorney, Agent or Firm:
HUH, Sung-Won et al. (Leaders Bldg.63, Seochojungang-ro,Seocho-gu, Seoul, KR)
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