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Patent Searching and Data


Title:
TEST SOCKET USING AIR GAP
Document Type and Number:
WIPO Patent Application WO/2017/131394
Kind Code:
A1
Abstract:
The present invention relates to a test socket for a semiconductor device using an air gap, the test socket comprising: a shield unit which has a plurality of clearance openings which are vertically perforated apart from each other, and accommodates a probe pin in each of the clearance openings; and holding units which are accommodated and fixed in the shield unit and hold the probe pins. The present invention causes a dielectric between the probe pins to have a dielectric constant close to 1 by using air, thereby being able to expand the outer diameter of a contactor and enhancing high frequency properties.

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Inventors:
CHOI, Jong Kook (#Ga-103, 29-6 Gumi-ro 116beon-gil, Bundang-gu,Seongnam-si, Gyeonggi-do, 13622, KR)
Application Number:
KR2017/000705
Publication Date:
August 03, 2017
Filing Date:
January 20, 2017
Export Citation:
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Assignee:
QUALMAX TESTECH, INC. (477 Hyeondeokseo-ro, Hyeondeok-myeonPyeongtaek-si, Gyeonggi-do, 17945, KR)
International Classes:
G01R1/04; G01R1/073; G01R31/28
Foreign References:
KR101534778B12015-07-09
JP2004325305A2004-11-18
JP2009156710A2009-07-16
JP2007178164A2007-07-12
JP2008145238A2008-06-26
Attorney, Agent or Firm:
HANSUNG INTELLECTUAL PROPERTY (4F. 23, Gangnam-daero 84-gilGangnam-gu, Seoul, 06233, KR)
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