TEST STRIP AND METHOD TO DETERMINE TEST STRIP COMPATIBILITY

Title:

TEST STRIP AND METHOD TO DETERMINE TEST STRIP COMPATIBILITY

Document Type and Number:

WIPO Patent Application WO/2016/097054

Kind Code:

A3

Abstract:

An analyte measurement system is disclosed herein. The analyte measurement system includes a test strip. The test strip includes at least two electrodes spaced apart in a reaction chamber, one of said electrodes including a conductive material having a coating applied thereupon. The analyte measurement system also includes an analyte measurement device. The analyte measurement device includes a strip port having connectors configured to coupled to the electrodes of the test strip. The applied coating enables a capacitance value of the test strip to be measured in order to determine compatibility of the test strip with the analyte measurement device.

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Inventors:

MILLS LEANNE (GB)
MACFIE GAVIN (GB)
CARDOSI MARCO (GB)
ROBERTS MICHAEL (GB)

Application Number:

PCT/EP2015/080094

Publication Date:

September 29, 2016

Filing Date:

December 16, 2015

Export Citation:

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Assignee:

CILAG GMBH INT (CH)

International Classes:

G01N27/327

Foreign References:

US20130008804A1	2013-01-10
US20130098776A1	2013-04-25
US20080093230A1	2008-04-24

Attorney, Agent or Firm:

BRUNNER, John, Michael, Owen et al. (GB)

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