Title:
TEST SYSTEM FOR MEMORY CARD
Document Type and Number:
WIPO Patent Application WO/2020/134034
Kind Code:
A1
Abstract:
A test system (100) for a memory card. The test system (100) comprises: a first circuit board (110), one side of which is provided with a plurality of contact groups (111) spaced apart from each other along the row direction, and the other side of which is provided with a socket (112) arranged along the row direction; and a second circuit board (120) which is provided thereon with a test circuit (122), wherein the second circuit board (120) is inserted into the socket (112) along a direction perpendicular to the first circuit board (110), and provides a test signal to the contact groups (111). The present system does not need to use a computer host to test the memory card, and improves the testing efficiency of the memory card.
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Inventors:
PANG WEIWEN (CN)
LI XIAOQIANG (CN)
LI XIAOQIANG (CN)
Application Number:
PCT/CN2019/096429
Publication Date:
July 02, 2020
Filing Date:
July 17, 2019
Export Citation:
Assignee:
HUAWEI TECH CO LTD (CN)
International Classes:
G11C29/56
Foreign References:
| CN106887257A | 2017-06-23 | |||
| CN104656003A | 2015-05-27 | |||
| CN101727989A | 2010-06-09 | |||
| CN103366830A | 2013-10-23 | |||
| US20090108859A1 | 2009-04-30 |
Other References:
See also references of EP 3889961A4
Attorney, Agent or Firm:
CHINA WISPRO INTELLECTUAL PROPERTY LLP. (CN)
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