TEST SYSTEM AND METHOD FOR CONTROLLING TEST SYSTEM

Title:

TEST SYSTEM AND METHOD FOR CONTROLLING TEST SYSTEM

Document Type and Number:

WIPO Patent Application WO/2024/048070

Kind Code:

A1

Abstract:

Provided is a test system that makes it possible to eliminate a response delay in a loading system due to an actuator or the like for setting a test piece in motion, and perform a simulation that includes a model and a real machine in real time with higher precision. For this purpose, a test system 1 is configured that comprises a test piece (40) as a portion of a real machine to be tested, an actuator (30) for setting the test piece (40) in motion, a virtual model (11) created in association with the test piece (40), a control device (20) that controls the actuator (30), a computation device (10) that computes the virtual model (11), a communication unit for communication between the test piece (40), the actuator (30), and the control device (20), and an inverse transfer function correction unit (50) that corrects a signal from the virtual model by means of a proper inverse transfer function that is determined on the basis of a transfer function of a system including the communication unit between the computation device (10) and the control device (20), the control device (20) controlling the actuator (30) on the basis of the signal corrected by the inverse transfer function correction unit (50).

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Inventors:

IN EISEI (JP)
HOSAKA TOMOHIRO (JP)
KAWANISHI HIROFUMI (JP)
ENOMOTO AYUMU (JP)

Application Number:

PCT/JP2023/024982

Publication Date:

March 07, 2024

Filing Date:

July 05, 2023

Export Citation:

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Assignee:

SAGINOMIYA SEISAKUSHO INC (JP)

International Classes:

G01M17/04; G01M13/00; G05B13/04; G05B23/02

Domestic Patent References:

WO2022070759A1	2022-04-07
WO2009110599A1	2009-09-11

Foreign References:

JP2009058522A	2009-03-19
JPH1151820A	1999-02-26
US5610330A	1997-03-11

Attorney, Agent or Firm:

TANI & ABE, P.C. (JP)

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