TEST SYSTEM - SHENZHEN RAYBOW OPTOELECTRONICS CO LTD

Title:

TEST SYSTEM

Document Type and Number:

WIPO Patent Application WO/2019/232794

Kind Code:

A1

Abstract:

A test system for testing a semiconductor laser chip. The test system comprises a loading and unloading device (110), a probe assembly (120) and an integrated sphere assembly (130). The loading and unloading device (110) comprises a plurality of stations (111), and the plurality of stations (111) are used for placing a chip to be tested. The probe assembly (120) comprises several probes (1211), and the several probes (1211) are arranged above the chip to be tested. The integrated sphere assembly (130) comprises an integrated sphere (131), the integrated sphere (131) is provided with an opening (1311), and the opening (1311) is arranged close to the chip to be tested. When a current flows through a pin of the chip to be tested by means of the probe (1211), the opening (1311) receives a light signal sent by the chip to be tested. According to the system, the probe assembly (120) and the integrated sphere assembly (130) are respectively configured to be movable in a vertical direction and a horizontal direction, and in this way, on one hand, a detection element is protected and the service life is prolonged, and on the other hand, a test speed is further improved through ordered motion.

More Like This:

JPS6057606	[Title of the Invention] A function discernment method of LSI
JP2004134565	METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
WO/2001/022097	MEASURING PROBE FOR MEASURING HIGH FREQUENCIES AND A METHOD FOR PRODUCING THE SAME

Inventors:

HU MARTIN HAI (CN)
LIU WENBIN (CN)
WANG TAISHAN (CN)
LI CHENGPENG (CN)
LI GUOQUAN (CN)

Application Number:

PCT/CN2018/090465

Publication Date:

December 12, 2019

Filing Date:

June 08, 2018

Export Citation:

Click for automatic bibliography generation Help

Assignee:

SHENZHEN RAYBOW OPTOELECTRONICS CO LTD (CN)

International Classes:

G01R31/26; G01M11/02

Foreign References:

CN106862110A	2017-06-20
CN106862110A	2017-06-20
CN204287405U	2015-04-22
CN207271655U	2018-04-27
CN206563647U	2017-10-17
CN105436100A	2016-03-30
CN205436349U	2016-08-10
CN206594069U	2017-10-27
CN207271654U	2018-04-27
CN202933873U	2013-05-15

Attorney, Agent or Firm:

CHINA WISPRO INTELLECTUAL PROPERTY LLP. (CN)

Download PDF:

View/Download PDF PDF Help

Previous Patent: TWO-CAMERA CALIBRATION METHOD, ELECTRONIC DEVICE AND COMPUTER-READABLE STORAGE MEDIUM

Next Patent: METHODS AND NODES FOR FACILITATING NON-IP UE-TO-UE COMMUNICATIONS