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Patent Searching and Data


Title:
TEST TRAY FOR TEST HANDLER AND INTERFACE BOARD FOR TESTER
Document Type and Number:
WIPO Patent Application WO/2016/080670
Kind Code:
A1
Abstract:
The present invention relates to a test tray for a test handler and an interface board for a tester. According to the present invention, a secondary calibration hole is additionally formed in an insert of a test tray, and a secondary calibration pin is provided in a socket guider of an interface board. In addition, an alignment hole is additionally formed in a test socket of an interface board, and an alignment pin is provided in the interface board. Accordingly, the position of an insert can be calibrated in divided steps. Furthermore, a wall surface forming a calibration hole of an insert body is cut, and an incision hole is formed around the calibration hole. According to the present invention, the position of an insert is calibrated sequentially in divided steps, thereby enabling very accurate calibration of the position of an insert. In addition, a calibration pin is prevented from being fitted into a calibration hole, thereby enabling formation of a smaller calibration hole and finer calibration of the position of an insert.

Inventors:
NA YUN SUNG (KR)
HWANG JUNG WOO (KR)
CHOI HEE JUN (KR)
Application Number:
PCT/KR2015/011433
Publication Date:
May 26, 2016
Filing Date:
October 28, 2015
Export Citation:
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Assignee:
TECHWING INC (KR)
International Classes:
G01R31/26; G01R1/04; G01R1/067; G01R31/27; G01R31/28
Foreign References:
KR20090010338A2009-01-30
KR20100071204A2010-06-29
KR20140091797A2014-07-23
KR20080044520A2008-05-21
KR20070062085A2007-06-15
Attorney, Agent or Firm:
TAEDONG INTERNATIONAL PATENT LAW FIRM (KR)
특허법인 태동 (KR)
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