TESTABLE IC HAVING ANALOG AND DIGITAL CIRCUITS - KONINKL PHILIPS ELECTRONICS NV

Title:

TESTABLE IC HAVING ANALOG AND DIGITAL CIRCUITS

Document Type and Number:

WIPO Patent Application WO1999056396

Kind Code:

A3

Abstract:

The invention relates to an integrated circuit with at least an analog and a digital circuit that ate interconnected by a signal path. In order to enable separate testing of the circuits, for example in accordance with the macro test approach, in the signal path a special seam circuit (200) is inserted. The seam circuit (200) is essentially a feedback loop (214) having a scannable flip-flop (210) and a multiplexer (220). The flip-flop (210) feeds a first input of the multiplexer (220), whereas a second input of the multiplexer (220) establishes an input (230) of the seam circuit (200). An output of the feedback loop (214) establishes an output of the seam circuit (200). The state of the multiplexer (220) defines the state of the seam circuit (200), in a first state of the multiplexer (220) the seam circuit (200) being transparent for signals being transferred along the signal path from one circuit to another, and in a second state of the multiplexer (220) the seam circuit (200) outputting a signal that was loaded in the feedback loop (214) beforehand.

Inventors:

PORTENERS GASTON M I
DE NIE ROBERT H
VAN DER HEIDEN JOHANNES T
JANSEN ROLAND P
DE JONG PETRUS A L
PALM PETRUS A J M
PRONK VINCENT

Application Number:

PCT/IB1999/000639

Publication Date:

January 06, 2000

Filing Date:

April 12, 1999

Export Citation:

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Assignee:

KONINKL PHILIPS ELECTRONICS NV (NL)
PHILIPS SVENSKA AB (SE)

International Classes:

G01R31/28; G01R31/3167; G01R31/3185; H03M1/00; (IPC1-7): G01R31/3167

Foreign References:

US5134638A	1992-07-28
US5477548A	1995-12-19

Other References: