TESTER, ADJUSTMENT METHOD, AND ADJUSTMENT PROGRAM

Title:

TESTER, ADJUSTMENT METHOD, AND ADJUSTMENT PROGRAM

Document Type and Number:

WIPO Patent Application WO/2008/007636

Kind Code:

A1

Abstract:

Provided is a tester for testing a device to be tested, which has data terminals and a clock output terminal for outputting a clock signal indicating the timing to acquire data signals outputted from the data terminals. The tester comprises a reference clock source for generating the reference clock of the tester, timing comparators which are provided corresponding to the data terminals and which acquire the data signals outputted from the data terminals in accordance with a timing clock acquired by adjusting the phase of the reference clock, and an adjusting means for adjusting the phase of the timing clock according to the clock signal and the timing clock.

Inventors:

SATO, Naoki (1-32-1 Asahi-cho, Nerima-k, Tokyo 71, 1790071, JP)
佐藤直樹 (〒71 東京都練馬区旭町１丁目３２番１号株式会社アドバンテスト内 Tokyo, 1790071, JP)
CHIBA, Noriaki (1-32-1 Asahi-cho, Nerima-k, Tokyo 71, 1790071, JP)

Application Number:

JP2007/063654

Publication Date:

January 17, 2008

Filing Date:

July 09, 2007

Export Citation:

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Assignee:

ADVANTEST CORPORATION (1-32-1, Asahi-cho Nerima-k, Tokyo 71, 1790071, JP)
株式会社アドバンテスト (〒71 東京都練馬区旭町１丁目３２番１号 Tokyo, 1790071, JP)
SATO, Naoki (1-32-1 Asahi-cho, Nerima-k, Tokyo 71, 1790071, JP)
佐藤直樹 (〒71 東京都練馬区旭町１丁目３２番１号株式会社アドバンテスト内 Tokyo, 1790071, JP)

International Classes:

G01R31/319; G01R31/3183; G01R31/28

Attorney, Agent or Firm:

RYUKA, Akihiro (5F Shinjuku Square Tower, 22-1 Nishi-Shinjuku 6-chome,Shinjuku-k, Tokyo 05, 1631105, JP)

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