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Patent Searching and Data


Title:
TESTER, DRIVER COMPARATOR CHIP, RESPONSE MEASURING DEVICE, CALIBRATION METHOD, AND CALIBRATION DEVICE
Document Type and Number:
WIPO Patent Application WO/2008/050607
Kind Code:
A1
Abstract:
A response measuring device (20) in which the output end of a driver (14) and the input end of a comparator (16) are terminated at the earth potential through a transmission path (30). The device (20) comprises a driver control section (32) for outputting a first output waveform having a rising edge and a second output waveform having a falling edge and a difference calculating section (38) for calculating the difference between the response times according to the difference between a first time from when a comparator (16) detects the rising edge of the first output waveform until when the comparator (16) detects the falling edge of a first reflection wave produced when the first output waveform is reflected by the termination and a second time from when the comparator (16) detects the falling edge of the second output waveform until when the comparator (16) detects the rising edge of a second reflection waveform produced when the second output waveform is reflected by the termination.

Inventors:
MATSUBARA YASUO (JP)
Application Number:
PCT/JP2007/069710
Publication Date:
May 02, 2008
Filing Date:
October 09, 2007
Export Citation:
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Assignee:
ADVANTEST CORP (JP)
MATSUBARA YASUO (JP)
International Classes:
G01R31/319; G01R35/00
Domestic Patent References:
WO2002068976A12002-09-06
Foreign References:
JPH0235814A1990-02-06
JPH0836037A1996-02-06
JP2000009801A2000-01-14
JP2001021620A2001-01-26
JP2853752B21999-02-03
US20040061507A12004-04-01
Attorney, Agent or Firm:
RYUKA, Akihiro (22-1 Nishi-Shinjuku 6-chom, Shinjuku-ku Tokyo 05, JP)
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