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Patent Searching and Data


Title:
TESTING APPARATUS, ADJUSTING APPARATUS, ADJUSTING METHOD AND ADJUSTING PROGRAM
Document Type and Number:
WIPO Patent Application WO/2007/072738
Kind Code:
A1
Abstract:
A testing apparatus for testing a device to be tested is provided with a plurality of signal inputting/outputting sections each of which has a signal outputting section and a signal inputting section. In each signal inputting/outputting section, a phase difference between output of the signal by the signal outputting section and input of the signal by the signal inputting section is adjusted to be substantially equal to that of other signal inputting/outputting sections. Then, in a status where the signal inputting/outputting sections are connected with each other, a shift quantity by which signal inputting timing is to be shifted for permitting the second signal inputting section to input the signal outputted by the first signal outputting section is detected. A shift quantity by which the signal input timing is to be shifted for permitting the first signal inputting section to input the signal outputted from the second signal outputting section is also detected. Based on such shift quantities, the phases of the signal input and output of the first and the second signal inputting/outputting sections are adjusted to be substantially the same.

Inventors:
MATSUBARA YASUO (JP)
TAKASAKI MANABU (JP)
Application Number:
PCT/JP2006/324971
Publication Date:
June 28, 2007
Filing Date:
December 14, 2006
Export Citation:
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Assignee:
ADVANTEST CORP (JP)
MATSUBARA YASUO (JP)
TAKASAKI MANABU (JP)
International Classes:
G01R31/28
Domestic Patent References:
WO2002101404A12002-12-19
Foreign References:
JPH09325174A1997-12-16
JPH11287844A1999-10-19
Attorney, Agent or Firm:
RYUKA, Akihiro (22-1 Nishi-Shinjuku 6-chom, Shinjuku-ku Tokyo, JP)
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