Title:
TESTING APPARATUS AND CONTROL METHOD THEREFOR
Document Type and Number:
WIPO Patent Application WO/2017/039182
Kind Code:
A1
Abstract:
The present invention relates to a testing apparatus and a control method therefor, with the purpose thereof being to allow a user to change time information, which is used in the system of an in vitro diagnostic apparatus, and the changed time information to be displayed and used in accordance with a reference time for each country. The present invention also relates to a testing apparatus and a control method therefor, with the purpose thereof being to determine the expiration status of the validity period of a testing medium, prevent the use of the testing medium, the validity period of which has expired, and analyze a subject being tested through a testing medium the validity period of which has not expired. The testing apparatus according to one embodiment comprises: a real-time clock (RTC) unit for providing the current time; a user interface unit for receiving, as an input, a time offset command for changing the current time and displaying same; a first offset management unit for calculating the time to be displayed by reflecting the time offset command, which has been received as an input, in the current time provided by the RTC unit; a second offset management unit for determining a reference time for determining the expiration status of the validity period of the testing medium on the basis of the current time provided by the RTC unit; a validity period obtainment unit for obtaining information on the validity period of the testing medium; and a control unit for determining the expiration status of the validity period of the testing medium on the basis of the determined reference time and the obtained information on the validity period of the testing medium.
Inventors:
GWON SE DO (KR)
Application Number:
PCT/KR2016/008970
Publication Date:
March 09, 2017
Filing Date:
August 16, 2016
Export Citation:
Assignee:
SAMSUNG ELECTRONICS CO LTD (KR)
International Classes:
G01N35/00; G01N33/53; G04G5/00
Domestic Patent References:
| WO2005065539A1 | 2005-07-21 |
Foreign References:
| KR20030094119A | 2003-12-11 | |||
| KR20080003404A | 2008-01-07 | |||
| US20120053436A1 | 2012-03-01 | |||
| KR20160019844A | 2016-02-22 |
Other References:
See also references of EP 3346275A4
Attorney, Agent or Firm:
SELIM INTELLECTUAL PROPERTY LAW FIRM (KR)
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