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Patent Searching and Data


Title:
TESTING APPARATUS, PIN ELECTRONIC CARD, ELECTRIC DEVICE AND SWITCH
Document Type and Number:
WIPO Patent Application WO/2007/043482
Kind Code:
A1
Abstract:
A testing apparatus for testing a device to be tested is provided with a pin electronic section for transmitting and receiving signals to and from the device; a pattern generating section for inputting a test pattern to the device through a pin electronic section; and a judging section for receiving an output signal from the device through the pin electronic section and judging conformity of the device based on the output signal. The pin electronic section is provided with an internal circuit for transmitting and receiving the signals to and from the device; a first transmitting path for connecting the internal circuit with the device; and a first switch which connects the first transmission path to a grounding potential when the device is not being tested, and separates the first transmission path from the grounding potential when testing the device.

Inventors:
AWAJI, Toshiaki (1-32-1 Asahi-cho, Nerima-k, Tokyo 71, 1790071, JP)
淡路 利明 (〒71 東京都練馬区旭町1丁目32番1号 株式会社アドバンテスト内 Tokyo, 1790071, JP)
SEKINO, Takashi (1-32-1 Asahi-cho, Nerima-k, Tokyo 71, 1790071, JP)
Application Number:
JP2006/320129
Publication Date:
April 19, 2007
Filing Date:
October 06, 2006
Export Citation:
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Assignee:
ADVANTEST CORPORATION (1-32-1, Asahi-cho Nerima-k, Tokyo 71, 1790071, JP)
株式会社アドバンテスト (〒71 東京都練馬区旭町1丁目32番1号 Tokyo, 1790071, JP)
AWAJI, Toshiaki (1-32-1 Asahi-cho, Nerima-k, Tokyo 71, 1790071, JP)
淡路 利明 (〒71 東京都練馬区旭町1丁目32番1号 株式会社アドバンテスト内 Tokyo, 1790071, JP)
International Classes:
G01R31/28; H01H37/52; H01H61/00; G01R31/28; H01H37/00; H01H61/00
Attorney, Agent or Firm:
RYUKA, Akihiro (5F Shinjuku Square Tower, 22-1 Nishi-Shinjuku 6-chome, Shinjuku-k, Tokyo 05, 1631105, JP)
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