Title:
TESTING APPARATUS, PROGRAM FOR TESTING APPARATUS, TEST PATTERN RECORDING MEDIUM, AND METHOD OF CONTROLLING TESTING APPRATUS
Document Type and Number:
WIPO Patent Application WO/2004/081593
Kind Code:
A1
Abstract:
A testing apparatus for testing a device under test, wherein a test pattern file used for testing the device under test is provided with a plurality of divided pattern recording areas for recording a plurality of divided patterns formed by dividing a test pattern for testing the device under test. The testing apparatus comprises a plurality of conversion processing units for converting divided patterns recorded in mutually different divided pattern recording areas in mutually parallel, and a test pattern generator for supplying test patterns converted by the plurality of conversion processing units to the device under test.
Inventors:
KUMAKI NORIO (JP)
Application Number:
PCT/JP2004/003282
Publication Date:
September 23, 2004
Filing Date:
March 12, 2004
Export Citation:
Assignee:
ADVANTEST CORP (JP)
KUMAKI NORIO (JP)
KUMAKI NORIO (JP)
International Classes:
G01R31/319; (IPC1-7): G01R31/3183
Domestic Patent References:
| WO1998043359A1 | 1998-10-01 |
Foreign References:
| JPH09298559A | 1997-11-18 | |||
| JPH1068760A | 1998-03-10 | |||
| JPH04161869A | 1992-06-05 | |||
| JPS5992367A | 1984-05-28 | |||
| JPS61274280A | 1986-12-04 | |||
| JPH0946629A | 1997-02-14 |
Other References:
See also references of EP 1605271A4
Attorney, Agent or Firm:
Ryuka, Akihiro (24-12 Shinjuku 1-chom, Shinjuku-ku Tokyo, JP)
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