Title:
TESTING APPARATUS
Document Type and Number:
WIPO Patent Application WO/2007/007658
Kind Code:
A1
Abstract:
A time and a cost required for test are reduced by permitting a driver, which supplies
a device to be tested with a test signal, to be shared with a plurality of terminals.
A testing apparatus (10) is provided with a test signal generating section (130)
for generating a test signal to be supplied to the device (20) to be tested; a driver
(140) for outputting the test signal; a switch (150) arranged on a wiring between
the driver (140) and a first terminal of the device (20) to be tested; a switch (160)
arranged on a wiring between the driver (140) and a second terminal of the device
(20) to be tested; and a connection control section (100), which turns on the switch
(150) and turns off the switch (160) at the time of supplying the first terminal
of the device (20) with the test signal, and turns off the switch (150) and turns
on the switch (160) at the time of supplying the second terminal with the test signal.
Inventors:
KURIHARA YASUSHI (JP)
SATO SHINYA (JP)
SATO SHINYA (JP)
Application Number:
PCT/JP2006/313550
Publication Date:
January 18, 2007
Filing Date:
July 07, 2006
Export Citation:
Assignee:
ADVANTEST CORP (JP)
KURIHARA YASUSHI (JP)
SATO SHINYA (JP)
KURIHARA YASUSHI (JP)
SATO SHINYA (JP)
International Classes:
G01R31/28
Domestic Patent References:
| WO2003008985A1 | 2003-01-30 | |||
| WO1999027376A1 | 1999-06-03 |
Foreign References:
| JPS63101782A | 1988-05-06 |
Other References:
See also references of EP 1909109A4
Attorney, Agent or Firm:
RYUKA, Akihiro (22-1 Nishi-Shinjuku 6-chom, Shinjuku-ku Tokyo 05, JP)
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