TESTING DEVICE AND TESTING SYSTEM

WIPO Patent Application WO/2016/101675

A1

A testing device comprises a testing bench (10) for testing a product, a base (20) and a bracket (30) which are connected with the testing bench (10), a switch (40) for controlling the power-on/off of the testing bench (10), and a clamp (50) for clamping the product; the clamp (50) is provided with a clamping block (51) for triggering the switch (40), the switch (40) is mounted on the base (20), and the clamp (50) is movably connected to the bracket (30) and can move relative to the testing bench (10). In the process that the clamp (50) moves toward the testing bench (10), the switch (40) is triggered by the clamping block (51) and the testing bench (10) is powered off. In the case that the clamp (50) is connected to the testing bench (10), the clamping block (51) is detached from the switch (40), and testing bench (10) is powered on to test the product; In the process that the clamp (50) moves to leave the testing bench (10), the switch (40) is triggered by the clamping block (51), the testing bench (10) is powered off, and the clamp (50) is detached from the testing bench (10). A testing system is also disclosed.

WEI WEIWEI (CN)
GUO YAOBIN (CN)
WANG HUI (CN)
JIAO HUANQING (CN)
ZHANG XIAOYI (CN)
HAN HUI (CN)

PCT/CN2015/091487

June 30, 2016

October 08, 2015

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ZTE CORP (CN)

G01R1/04

WO1994015220A1	1994-07-07
WO2007005042A1	2007-01-11
WO1997011379A1	1997-03-27

CN204374238U	2015-06-03
CN203164219U	2013-08-28
CN102735882A	2012-10-17

CHINA PAT INTELLECTUAL PROPERTY OFFICE (CN)
北京派特恩知识产权代理有限公司 (CN)

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