CROSS-REFERENCE TO RELATED APPLICATIONS

[0001] This application claims the benefit of U.S. Provisional Patent Application No.: 62/928,427 filed October 31, 2019 and entitled “Testing and Inspection Method and System”, the entirety of which is incorporated by reference.

BACKGROUND AND INDUSTRIAL APPLICABILITY

[0002] Non-destructive testing (NDT) may refer to a class of analytical techniques that may be used to inspect a target, without causing damage, to ensure that the inspected target meets required specifications. NDT may be employed in a wide variety of industries such as aerospace, power generation, oil and gas transport or refining, and transportation. In some industries, NDT systems and related structures are integrated into surrounding infrastructure and are not easily removed or adjusted. As an example, in the transportation industry, an inspection system may be employed to test and inspect railroad train wheels of a railroad train car. Global railroad standards require train wheels to be inspected after manufacture and during maintenance on a regular basis.

SUMMARY

[0003] In one embodiment, a method may include providing a transport system for supporting and moving an inspection system, the inspection system including a positioning device configured to adjust an offset between the inspection system and an inspection object of a vehicle. The method may also include moving the vehicle into a first position that exposes the inspection object of the vehicle; moving the transport system into a second position proximate to the first position. The method may further include adjusting, with the positioning device, a third position of the inspection system to reduce the offset between the inspection system and the inspection object.

[0004] One or more of the following features may be included in any feasible combination.

[0005] In one embodiment, the method may include determining at least one position of at least one of the inspection object, the vehicle, the transport system, the inspection system, the positioning device, and the offset. The method may also include determining instructions for the adjusting, with the positioning device, the third position of the inspection system to reduce the offset between the inspection system and the inspection object. The method may further include providing the instructions to at least one of the vehicle, the transport system, the inspection system, and the positioning device.

[0006] In one embodiment, the method may include a device, the device having at least one processor and a memory storing at least one program for execution by the at least one processor, the at least one program including instructions, which, when executed by the at least one processor cause the at least one processor to perform operations. The operations may include determining, with the at least one processor, at least one position of at least one of the inspection object, the vehicle, the transport system, the inspection system, the positioning device, and the offset. The operations may also include determining, with the at least one processor, instructions for the adjusting, with the positioning device, the third position of the inspection system to reduce the offset between the inspection system and the inspection obj ect. The operations may further include transmitting, with the at least one processor, the instructions to at least one of the vehicle, the transport system, the inspection system, and the positioning device.

[0007] In one embodiment, the positioning device may include a sliding table. The sliding table may include a first table configured to move in a first direction. The sliding table may include a second table configured to move in a second direction. The first direction may be transverse to the second direction. The first direction and the second direction may be horizontal.

[0008] In one embodiment, the positioning device may include a scissor lift configured to move the inspection system in a vertical direction.

[0009] In one embodiment, the positioning device may include a rotation joint configured to rotate the inspection system about a vertical axis.

[0010] In one embodiment, the inspection system may include a bracket configured to engage a primary support structure configured to support the vehicle, and the bracket may be configured to move in a horizontal direction.

[0011] In one embodiment, the positioning device may be configured to move the inspection system in at least one linear direction of at least one transverse axis and in at least one rotational direction about the at least one transverse axis. [0012] In one embodiment, the transport system may include a plurality of independently driven wheels configured to move the transport system.

[0013] In one embodiment, the transport system may include a plurality of pressurized air sliders configured to move the transport system.

[0014] In one embodiment, the inspection object may be a railroad train wheel, and the vehicle may be a railroad train car.

[0015] In one embodiment, a system may include an inspection system including a positioning device configured to adjust an offset between the inspection system and an inspection object of a vehicle. The system may also include a transport system for supporting and moving the inspection system.

[0016] In one embodiment, the system may include a device having at least one processor and a memory storing at least one program for execution by the at least one processor, the at least one program including instructions, when, executed by the at least one processor cause the at least one processor to perform operations. The operations may include determining, with the at least one processor, at least one position of at least one of the inspection object, the vehicle, the transport system, the inspection system, the positioning device, and the offset. The operations may also include determining, with the at least one processor, instructions for the adjusting, with the positioning device, the position of the inspection system to reduce the offset between the inspection system and the inspection object. The operations may further include transmitting, with the at least one processor, the instructions to at least one of the vehicle, the transport system, the inspection system, and the positioning device.

[0017] In one embodiment, a non-transitory computer- readable storage medium storing at least one program for inspecting an inspection object of a vehicle is provided. The at least one program may be for execution by at least one processor and a memory storing the at least one program. The at least one program may include instructions, when, executed by the at least one processor cause the at least one processor to perform operations. The operations may include determining, with the at least one processor, at least one position of at least one of the inspection object, the vehicle, the transport system, the inspection system, the positioning device, and the offset. The operations may also include determining, with the at least one processor, instructions for the adjusting, with the positioning device, the third position of the inspection system to reduce the offset between the inspection system and the inspection object. The operations may further include transmitting, with the at least one processor, the instructions to at least one of the vehicle, the transport system, the inspection system, and the positioning device.

[0018] These and other capabilities of the disclosed subject matter will be more fully understood after a review of the following figures, detailed description, and claims.

DESCRIPTION OF DRAWINGS

[0019] These and other features will be more readily understood from the following detailed description taken in conjunction with the accompanying drawings, in which:

[0020] FIG. 1A is a side view of a transport system and an inspection system including a positioning device for offset adjustment according to one exemplary embodiment;

[0021] FIG. IB is an exploded, perspective view of the positioning device for offset adjustment;

[0022] FIG. 2 is a side view of a cross section of one exemplary embodiment of the positioning device for offset adjustment;

[0023] FIG. 3 A is a side view of a cross section of one exemplary embodiment of a rotation joint of the positioning device;

[0024] FIG. 3B is a plan view of the rotation joint;

[0025] FIG. 4 is a plan view of the transport system showing a top side of the inspection system in a position where a center of the inspection system is aligned with a center of an inspection object;

[0026] FIG. 5 is a plan view of the transport system and the inspection system in a position where the center of the inspection system is offset from the center of the inspection object in a first vehicle width direction;

[0027] FIG. 6 is a plan view of the transport system and the inspection system in a position where the center of the inspection system is offset from the center of the inspection object in a second vehicle width direction; [0028] FIG. 7 is a plan view of the transport system and the inspection system in a position where the inspection system is offset in a counterclockwise rotational direction about an axis extending in a vehicle height direction through the center of the inspection object;

[0029] FIG. 8 is a plan view of the transport system and the inspection system in a position where the inspection system is offset in a clockwise rotational direction about the axis through the center of the inspection object;

[0030] FIG. 9 is a side view of the transport system and the inspection system in a position where the center of the inspection system is aligned with a center of the inspection object;

[0031] FIG. 10 is a side view of the transport system and the inspection system in a position where the center of the inspection system is offset from the center of the inspection object in a reverse vehicle travel direction;

[0032] FIG. 11 is a side view of the transport system and the inspection system in a position where the center of the inspection system is offset from the center of the inspection object in a forward vehicle travel direction;

[0033] FIG. 12 is a side view of the transport system and the inspection system in a stowed position where an uppermost portion of the inspection system is located below a lowermost portion of a primary rail supporting the inspection object;

[0034] FIG. 13 is a side view of the transport system with the inspection system lifted vertically in a vehicle height direction into a deployed position where the inspection system is operationally engaged with the inspection object and where an uppermost portion of the inspection system is located above an uppermost portion of the primary rail;

[0035] FIG. 14 is a plan view of the transport system and the inspection system with arrows indicating freedom of movement of the inspection system in the vehicle travel direction, the vehicle width direction, clockwise rotation about the axis extending in the vehicle height direction, and counterclockwise rotation about the axis extending in the vehicle height direction;

[0036] FIG. 15 is a side view of the transport system and the inspection system with arrows indicating freedom of movement of the inspection system in the vehicle height direction; [0037] FIG. 16 is a side view of the transport system and the inspection system with the inspection system in the deployed position, with the positioning device extended in the vehicle height direction, and with the positioning device extended in the reverse vehicle travel direction;

[0038] FIG. 17A is a front view of the transport system and the inspection system with the inspection system in a pre-position, with the positioning device extended in the vehicle height direction, and with the positioning device extended in the vehicle width direction;

[0039] FIG. 17B is a front view of the transport system and the inspection system with the inspection system in the deployed position, and with at least one bracket extending laterally outward in the vehicle width direction from the inspection system and engaging with the primary rail;

[0040] FIG. 18 is a plan view of the transport system and the inspection system in a position where the transport system is offset in the clockwise rotational direction about the axis through the center of the inspection object, with the inspection system offset in the counterclockwise rotational direction relative to the axis;

[0041] FIG. 19 is a front perspective view of a facility of the related art in which a vehicle on primary rails is located above a pit containing support rails for an inspection system;

[0042] FIG. 20 is a front perspective view of another facility of the related art in which a vehicle on primary rails is located above a horizontal surface without a pit and without support rails for an inspection system;

[0043] FIG. 21A is a first portion of a process diagram illustrating a method of inspecting an inspection object of a vehicle;

[0044] FIG. 2 IB is a second portion of the process diagram; and

[0045] FIG. 22 is a schematic depiction of a computer device or system including at least one processor and a memory storing at least one program for execution by the at least one processor.

[0046] For purposes of reference, in some of the drawings, a legend is provided indicating references for a three-axis system with two directions for each axis. Specifically, a pair of crossed two-headed arrows represent two axes in the plane of the page (e.g., in FIG. 1 A, the x-axis extends toward the left and right sides of the plane of the page, and the z-axis extends toward the top and bottom sides of the plane of the page); a circle with a dot in the middle (representing a head of an arrow) represents a first direction of a third axis extending orthogonally out of the page towards the reader; and a circle with an “X” in the middle (representing a tail of an arrow) represents a second direction of the third axis extending orthogonally into the page away from the reader. Each axis is labeled with “x”, “y” and “z” corresponding to the three primary directions of the three- axis system, and plus (+) and minus (-) signs are used to delineate between different directions along the same axis. The legends are adjusted for each page in a manner consistent across the different drawings. The references described above are provided throughout the present disclosure. The depiction of structures using these references is exemplary and should not be construed as limiting in any way. The disclosed structures may be provided in any suitable configuration regardless of the manner depicted in the drawings. Each of the x-axis and the y-axis may be a horizontal axis, and the z-axis may be a vertical axis.

[0047] It is noted that the drawings are not necessarily to scale. The drawings are intended to depict only typical aspects of the subject matter disclosed herein, and therefore should not be considered as limiting the scope of the disclosure. Those skilled in the art will understand that the structures, systems, devices, and methods specifically described herein and illustrated in the accompanying drawings are non-limiting exemplary embodiments and that the scope of the present invention is defined solely by the claims.

DETAILED DESCRIPTION

[0048] Accuracy of NDT inspection depends in part on alignment between an inspection system and an inspection object. NDT systems and related structures according to the related art are integrated into surrounding infrastructure and are not easily removed or adjusted. Also, variations in infrastructure cause misalignment between inspection systems and inspection objects. Further, transport systems according to the related art tend to have limited maneuverability. As a consequence, accuracy of NDT inspection is negatively impacted. A method and system of inspection involving a transport system, an inspection system and a positioning device are described that result in improved accuracy of inspection. The positioning device facilitates movement of the inspection system into a position independent of the position of the transport system and aligned with the inspection object. Also, an offset between the inspection system and the inspection object due to, for example, variations in infrastructure or inaccuracy of the transport system, may be reduced. The method and system promote improved accuracy and reliability for NDT inspection.

[0049] For instance, in a facility according to the related art, as seen, for example, in FIG. 19, dedicated infrastructure is provided for placement of a vehicle 30, such as a train car, to be inspected on a primary support structure, such as primary rails 1930, at a level higher than a ground level 1910. Thus, train wheels and a lower side 32 of the vehicle 30 are made accessible, for example by a human worker, from below the train. In some systems, an inspection system is provided in a pit 1940 below the ground level 1910, and the inspection system is moved on support rails 1920 in the pit 1940 under the vehicle 30. The support rails 1920 and the pit 1940 limit freedom of movement of an inspection system.

[0050] In another facility according to the related art, as seen, for example, in FIG. 20, the support rails and the pit are not required. Infrastructure is provided for placement of the vehicle 30 to be inspected on a primary support structure, such as primary rails 2030, at a level higher than a ground level 2010. Again, train wheels and a lower side of the vehicle 30 are made accessible. Inspections systems may be provided to move underneath the vehicle 30. However, such systems do not provide freedom of movement in multiple directions, nor do such systems take into account misalignment or offset between the inspection system and the inspection object.

[0051] Variations in infrastructure, which are common to such facilities, further complicate the problem. For example, the ground level at some railroad testing and inspection facilities (e.g., ground level 1910 shown in FIG. 19 or ground level 2010 shown in FIG. 20) may exhibit local misalignments of +/- 20 mm (-0.7874 inch) further negatively impacting alignment of the inspection system to the inspection object and reducing accuracy of inspection results.

[0052] Various aspects of the disclosed subject matter may provide improved methods and systems to accurately perform inspection operations without the need for support rails, and without the need for an inspection pit. Also, various aspects of the disclosed subject matter may provide improved freedom of movement of the inspection system and related transport systems relative to the transport system for the inspection system and relative to the inspection object itself. [0053] The facilities of the related art described above and shown in FIGS. 19 and 20 have significant problems with accuracy and repeatability of testing and inspection. Contributing to the problems, with some NDT inspection systems, precise alignment of the inspection system with respect to the inspection object is important to the accuracy of the inspection. With the facilities shown in FIGS. 19 and 20, it may be difficult to position the NDT/inspection system accurately with respect to an inspection object, such as the wheels of the train.

[0054] In FIG. 19, when the inspection system is configured to move on the support rails 1920, which are fixed, the support rails 1920 only provide limited range-of-motion when positioning the inspection system underneath the inspection object. Specifically, the support rails 1920 permit linear motion of the inspection system in a horizontal direction parallel to a direction of movement of the vehicle 30. However, the support rails 1920 do not permit motion of the inspection system riding on the support rails 1920 in a horizontal direction transverse to the direction of the movement of the vehicle. Also, the support rails 1920 do not permit motion of the inspection system in a vertical direction or rotation about an axis.

[0055] Similarly, when the support rails are removed as shown in FIG. 20, a tow path for an inspection system is provided between vertical support columns 2020. However, similar to the facility shown in FIG. 19, the tow path shown in FIG. 20 still only permits linear motion of the inspection system in a horizontal direction parallel to a direction of movement of the vehicle 30. It is relatively easy to inadvertently move the inspection system or rotate the inspection system into a misaligned position and away from a desirable position with respect to an inspection object on the vehicle 30. Also, the system as a whole does not permit motion of the inspection system in a vertical direction or rotation about an axis.

[0056] Any offset in the positioning of an inspection system, particularly an NDT/inspection system, in any or all of the x, y and z directions and/or rotationally about axes defined by any or all of the x, y and z directions contributes to an offset in probes attached to the NDT/inspection system relative to the inspection object. For purposes of reference, arrows 2050 in FIG. 20 indicate the vehicle travel direction or x-direction, arrows 2060 indicate the vehicle width direction or y- direction, and circular arrows 2070 indicate rotation about an axis in a vertical direction or z- direction. A vertical distance 2025 between the ground 2010 and a lowermost portion 2040 of the vehicle 30 (or a height of the support column 2020) is greater than a height of the inspection system to permit horizontal movement.

[0057] Any offsets between the inspection system and the vehicle have a direct negative affect on testing results. Since repeatability and reliability of testing and inspection depend on accurate and repeatable positioning of probes on a wheel to be inspected, and since, as described above, facilities of the related art allow freedom of movement in one primary direction, the facilities and systems of the related art resulted in inconsistency, poor repeatability and lack of reliability. In other words, the systems of the related art resulted in poor testing results.

[0058] Without the support rail of FIG. 19 in the system of FIG. 20, while it may be theoretically possible to position a transport system for an inspection system moving on the ground with extreme accuracy to ensure precise placement of the inspection system with respect to the inspection object, such extreme accuracy requires a highly accurate transport system. In an industrial surrounding with dirt, debris, water, and obstacles (such as other transport systems, employees and/or barriers) in the way, collisions may occur. Also, such extreme accuracy requires a relatively clean surrounding; further, ground level is desirably extremely flat. In railroad facilities, extremely flat floors are not feasible due, for example, to the requirement for runoffs and markers in the floor. Also, in such facilities, distances between vertical support columns for train rails and vehicles may be required to be within minimal tolerances, e.g., regular intervals over a length of approximately 400 meters or 437.5 yards. As such, sufficient accuracy necessary for NDT inspection is not easily realized.

[0059] Accordingly an improved flexible NDT/inspection system and corresponding methods are provided that improve repeatability and reliability of testing and inspection.

[0060] A flexible NDT/inspection system is provided. The flexible NDT/inspection system adjusts the offsets caused by the infrastructure and positioning of a transport system relative to an inspection system. Offsets in positioning of the NDT/inspection system relative to an inspection object may be adjusted by providing an offset adjustment device (such as a positioning device) between a transport system and an NDT/inspection system; as an integrated part of the transport system; as an integrated part of the NDT/inspection system; or portions of the offset adjustment device may be distributed within and between the transport system and the inspection system. With the offset adjustment device, the position of the NDT/inspection system and the probes thereof do not depend on the positional accuracy of the transport system or the infrastructure associated with a particular inspection facility. The positional accuracy of the transport system and restrictions imposed by portions of permanent infrastructure do not negatively impact testing results. The positioning device for offset adjustment may be a sliding table. The NDT/inspection system may be provided on a transport system disengaged from any support rail and configured to move on ground level.

[0061] Distinct benefits arise from the flexible NDT/inspection system according to exemplary embodiments disclosed herein. The NDT/inspection process is not limited to a certain support rail and thus to a certain type of train (parked above the support rail). Advantageously, the flexible NDT/inspection system may be used for inspection of many types of trains waiting for inspection at a train operator or train manufacturing site. Flexibility and equipment availability increase. Accessibility during repair and maintenance increase since the NDT/inspection system may be placed in close proximity to a vehicle such as a railroad train car. Additionally, compared to transport systems that require a support rail (such as support rails 1920 shown in FIG. 19), transport systems disengaged from such support rails are beneficial in terms of reduced maintenance of the transport systems, e.g., standard spare parts, easily combined with other transport systems already in use, and the like.

[0062] In addition, before, during and/or after an inspection of a vehicle such as a train, a check and/or recheck of a test specimen may be ordered to validate the NDT/inspection system. Since the flexible NDT/inspection system is not engaged to a support rail, a validation of the NDT/inspection system at a given specimen does not block primary rails in the facility. Trains may be moved parallel to the validation NDT/inspection system. Therefore, availability of train and/or rail equipment increases.

[0063] Certain exemplary embodiments will now be described to provide an overall understanding of the principles of the structure, function, manufacture, and use of the systems, devices, and methods disclosed herein. One or more examples of these embodiments are illustrated in the accompanying drawings. Those skilled in the art will understand that the systems, devices, and methods specifically described herein and illustrated in the accompanying drawings are non- limiting exemplary embodiments and that the scope of the present invention is defined solely by the claims. The features illustrated or described in connection with one exemplary embodiment may be combined with the features of other embodiments. Such modifications and variations are intended to be included within the scope of the present invention. Further, in the present disclosure, like-named components of the embodiments substantially have similar features, and thus within a particular embodiment each feature of each like-named component is not necessarily fully elaborated upon.

[0064] An offset adjustment device, which is configured to adjust offsets, may be provided to achieve repeatable and reliable inspection results. As shown, for example, in FIG. 1, a positioning device 100 may be provided, which adjusts offsets caused, for example, by fixed infrastructure and/or misalignment in positioning of a transport system 10. The transport system 10 may be configured to move forward and back (in the +x and -x directions), to move left and right (in the +y and -y directions) and to rotate or turn in place (about the z-axis). As shown in FIG. 1 A, the transport system 10 may be equipped with a plurality (e.g., 4, 8 or more) of driving mechanisms 12 (two are visible in FIG. 1 A) configured to permit movement forward, back, left and right and configured to rotate or turn the in place about an axis. The driving mechanisms 12 may be a plurality of independent wheels. At least one of the plurality of independent wheels may be omnidirectional. At least one of the independent wheels may be driven (i.e., each of the wheels 12 may be an independently driven wheel) and/or passive. The driving mechanisms 12 may be a plurality of pressurized air sliders configured to move the transport system.

[0065] Offsets in positioning of an NDT/inspection system 20 with respect to an inspection object may be adjusted by movement of the transport system 10 with respect to the NDT/inspection system 20 using the positioning device 100. The positioning device 100 may be provided between the transport system 10 and the NDT/inspection system 20, within the transport system 10, within the NDT/inspection system 20 itself, or distributed in and between the transport system 10 and the inspection system 20. Due to provision of the offset positioning device 100, a position of the NDT/inspection system 20 and a position of corresponding probes mounted on the NDT/inspection system 20 do not depend on a positional accuracy of the NDT/transport system 10 itself or infrastructure variations on site. In other words, potential negative impacts on testing results caused by various factors - e.g., positional accuracy of the transport system (or lack thereof), spatial restrictions imposed by infrastructure, misalignment due to variations in infrastructure, and the like - are reduced. Thus, repeatability and reliability of testing may be solely or primarily dependent on the NDT/inspection system. The positioning device 100 may include a sliding table as shown in FIG. IB and FIG. 2. The positioning device 100 is not limited to the sliding table and may include other suitable structures such as a pair of linear sliding mechanisms.

[0066] As shown in FIG. IB and FIG. 2, the positioning device 100 may include a plurality of plates configured to move in different directions. (See, also, FIGS. 16 and 17A for examples of the positioning device 100 in different positions.) The positioning device 100 may be a cross sliding table for movement and alignment in at least two directions. For example, the positioning device 100 may include a base plate 110, a first plurality of supports 115 on the base plate 110, a first sliding mechanism 120 on the supports 115, alowerplate 130 (or first table) on the first sliding mechanism 120, a support plate 140, a second plurality of supports 145 on the support plate 140, a second sliding mechanism including a receiving part 150 and a sliding part 155 on the supports 145, and an upper plate 160 (or second table) on the sliding part 155. A first cylinder having an upper part 170 and a lower part 180 may be provided to position the first sliding mechanism 120 via the lower plate 130; and a second cylinder having a lateral part 190 and a central part 195 may be provided to position the second sliding mechanism 150/155 via the upper plate 160. The first cylinder 170/180 and the second cylinder 190/195 may be configured to center the sliding table into a home position and/or to position the sliding table into a specific position or pre-position.

[0067] As shown in FIG. 2, the positioning device 100 may permit movement of the upper plate 160 in at least two directions, e.g., in both directions of the x-axis, i.e., -x direction, +x direction, and in both directions of the y-axis, i.e., -y direction, +y direction. The pneumatic cylinders 180 and 190 may drive movement of the upper plate 160 in at least two directions, e.g., in both directions of the y/x -plane, i.e., -y direction, +x direction or -x direction, +x direction. The x- axis and y-axis may be horizontal.

[0068] A rotation joint may be provided on or within the positioning device 100. For example, as shown in FIGS. 3A and 3B, a self-centering rotation joint 300 may be provided. The rotation joint 300 may include a base plate 310 installed on the positioning device 100, a wedge 320 to center the rotation joint 300, a rotatable part 330 configured to support testing equipment and the like, and a rotation bolt 340. The rotation joint 300 may be configured to raise and lower surrounding structures in a vertical direction along the z-axis. For example, the rotation joint 300 may be provided between the positioning device 100 and test equipment configured to test and inspect the inspection object (e.g., train wheel). The rotation joint 300 maybe configured to adjust a rotational position about the z-axis relative to the positioning device 100 and/or the transport system 10. The rotation joint may include rubber buffers.

[0069] As shown in FIG. 4, a top side of the inspection system 20 (over the transport system 10) may be provided in a position where a center of the inspection system 20 is aligned with a center of an inspection object 35, e.g., a railroad train wheel (the inspection object 35 is not shown in FIG. 4, but may be seen in any of FIGS. 9-13, 15 and 16). The center of the inspection object 35 corresponds with an intersection of line 410 in the y-direction and line 430 in the x-direction. The center of the inspection system 20 corresponds with an intersection of line 420 in the y-direction and line 440 in the x-direction. In this case, since the centers are aligned, the lines 410 and 420 and lines 430 and 440 overlap. The transport system 10 and the inspection system 20 may be positioned in a facility such as that shown in FIG. 20, i.e., as viewed in FIG. 4, in between support columns 2020 and primary rails 2030.

[0070] As shown in FIG. 5, the transport system 10 and the inspection system 20 may be shifted relative to the inspection object, i.e., the transport system 10 and the inspection system 20 are in a position where the center of the inspection system 20 is offset a distance 435 apart from the center of the inspection object in a first vehicle width direction (+y direction).

[0071] As shown in FIG. 6, the transport system 10 and the inspection system 20 may be configured to move into a position where the center of the inspection system 20 is offset a distance 435 apart from the center of the inspection object in a second vehicle width direction (-y direction).

[0072] As shown in FIG. 7, the transport system 10 and the inspection system 20 may be configured to move into a position where the inspection system 20 is rotated counterclockwise at an angle of rotation 445 relative to an axis (z-axis) extending in a first vehicle height direction (+z direction). [0073] As shown in FIG. 8, the transport system 10 and the inspection system 20 may be configured to move into a position where the inspection system 20 is rotated clockwise at an angle of rotation 445 relative to the axis (z-axis).

[0074] As shown in FIG. 9, the transport system 10 and the inspection system 20 may be configured to move into a position where the center of the inspection system 20 is aligned with a center of the inspection object 35. That is, the center of the inspection system 20 is aligned with a center of the inspection object 35 along an axis 910 in the z-direction.

[0075] As shown in FIG. 10, the transport system 10 and the inspection system 20 may be configured to move into a position where the center of the inspection system 20 to the axis 910 is offset from the center of the inspection object 35 to an axis 920 in the z-direction, where a distance 915 of the offset extends in a reverse vehicle travel direction (-x direction).

[0076] As shown in FIG. 11, the transport system 10 and the inspection system 20 may be configured to move into a position where the center of the inspection system 20 to the axis 910 is offset from the center of the inspection object to the axis 920, where the distance 915 of the offset extends in a forward vehicle travel direction (+x direction).

[0077] As shown in FIG. 12, the inspection system 20 may be configured to move into a stowed position relative to the transport system, where an uppermost portion of the inspection system 20 reaches a height (where the height is depicted with a line 1210 extending in the x-direction) that is below a height of a lowermost portion of a primary rail 2030 supporting an inspection object 35.

[0078] As shown in FIG. 13, the inspection system 20 may be lifted by a lifting mechanism, such as a scissor lift 22, from the transport system 10 into a deployed position, where the inspection system 20 is operationally engaged with the inspection object 35 at a height (where the height is depicted with a line 1220 extending in the x-direction) where an uppermost portion of the inspection system 20 is located above an uppermost portion of the primary rail 2030, which permits portions of the inspection system 20 to operationally engage with the inspection object 35. The lifting mechanism is not limited to the scissor lift 22 and may include other suitable structures such as a pneumatic cylinder, linear sliding mechanism, or structure configured to move the inspection system 20. [0079] The inspection object 35 may be a wheel set for a railroad car. As seen in FIG. 13, for example, a position of the inspection system 20 may be adjusted to compensate for the offset in the x-direction with the positioning device 100. As described elsewhere, linear offsets in the y- direction and the z-direction and rotational offsets about the z-axis may be adjusted. Once alignment of the inspection system 20 with the wheelset is achieved, engaging components of the inspection system 20 may be mechanically centered on the wheelset. Also, lifting components, such as the scissor lift 22, may lift the wheelset via the engaging components of the inspection system 20. Since the wheelset is mounted on the train car, the wheelset may maintain a position similar to a position before, during and after engagement with the inspection system.

[0080] As shown in FIG. 14, the transport system 10 and the inspection system 20 are depicted with arrows 1410 indicating freedom of movement of the inspection system 20 in plural directions, i.e., the reverse vehicle travel direction (-x direction) and in the forward vehicle travel direction (+x direction), with arrows 1420 indicating freedom of movement of the inspection system 20 in the first vehicle width direction (+y direction) and in the second vehicle width direction (-y direction), and with clockwise and counterclockwise rotation arrows 1430 about the axis (z-axis) extending in the first vehicle height direction (+z direction).

[0081] As shown in FIG. 15, the transport system 10 and the inspection system 20 are depicted with arrows 1510 indicating freedom of movement of the inspection system 20 in the first vehicle height direction (+z direction) and a second vehicle height direction ( z direction).

[0082] As shown in FIG. 16, the inspection system 20 may be configured to move into the deployed position, with the positioning device 100 extended a distance 1635 in the +z direction to achieve z-direction alignment with the inspection object 35, and with the positioning device 100 extended a distance 1615 in the -x direction to achieve x-direction alignment with the inspection object 35. The distance 1615 is a distance between an edge 1610 of a lower portion (e.g., 130) of the positioning device 100 in a static position and an edge 1620 of an upper portion (e.g., plate 160) of the positioning device 100 in a deployed position. The distance 1635 is a distance between a height 1630 of a bottom surface of the lower portion of the positioning device 100 in the stowed position and a height 1640 of the bottom surface of the lower portion of the positioning device 100 in the deployed position. [0083] As shown in FIG. 17 A, the inspection system 20 may be configured to move into a pre position, with the positioning device 100 extended the distance 1635 in the +z direction to achieve z-direction alignment with the inspection object 35, and with the positioning device 100 extended a distance 1715 in the +y direction to achieve y-direction alignment with the inspection object 35. The distance 1715 is a distance between an edge 1710 of a lower portion (e.g., 130) of the positioning device 100 in a static position and an edge 1720 of an upper portion (e.g., plate 160) of the positioning device 100 in a deployed position. The offset in the z-direction may be controlled by a programmable logic controller (PLC) and/or linear position sensor.

[0084] As shown in FIG. 17B, The offset in the y-direction may be mechanically centered between primary rails 2030. Components of the inspection system 20 may be configured to expand in the y-direction to span the gap between the inspection system 20 and the primary rails 2030. For example, the inspection system 20 may include at least one bracket 1750 extending laterally outward in the vehicle width direction (the y-direction) from the inspection system 20. The bracket 1750 may be configured to engage with the primary rail 2030. The arrow 1730 indicates the direction of movement in the y-direction of the bracket 1750 between a stowed or pre-position (FIG. 17 A) and a deployed position (FIG. 17B). The arrow 1745 indicates the width in the y- direction between inner facing surfaces of each primary rail 2030. The engagement of the bracket 1750 with the primary rail 2030 stabilizes the transport system 10 and the inspection system 20, which may further ensure positional accuracy of the inspection system 20 relative to the inspection object 35.

[0085] As shown in FIG. 18, the transport system 10 and the inspection system 20 may be configured to move to a position where the transport system 10 is rotated clockwise relative to the axis (z-axis) through the inspection object 35, with the inspection system 20 rotated counterclockwise relative to the axis (z-axis) through the transport system 10 to achieve z-axis rotational alignment between the inspection system 20 and the inspection object 35. Compare FIG. 18 with FIG. 7 or FIG. 8, in which the inspection system 20 is not rotationally aligned with the inspection object 35. In other words, the transport system 10 can be rotationally misaligned with the inspection object 35, but the inspection system 20 can be rotationally aligned with the inspection object 35. The inspection system 20 may be rotated clockwise or counterclockwise about the z-axis with the rotation joint 300 (FIG. 3).

[0086] As shown in FIGS. 21 A, the above-referenced structures may be used in a method 2100 of inspecting an inspection object 35 of a vehicle 30. A transport system 10 may be provided for supporting and moving an inspection system 20. The inspection system 20 may include a positioning device 100 configured to adjust an offset (e.g., 435, 445, 915, 1615, and/or 1635) between the inspection system 20 and the inspection object 35. The method 2100 may comprise: moving 2110 the vehicle 30 into a first position that exposes the inspection object 35 of the vehicle 30; moving 2120 the transport system 10 into a second position proximate to the first position; and adjusting 2130, with the positioning device 100, a third position of the inspection system 20 to reduce the offset between the inspection system 20 and the inspection object 35. The movement of the transport system 10 into the second position proximate to the first position of the vehicle 30 may refer to a position that is within a range of adjustment of the positioning device 100. The term “reduce the offset” may refer to a position of the inspection system 20 that is offset by about or less than 10%, 9%, 8%, 7%, 6%, 5%, 4%, 3%, 2%, 1%, 0.5%, 0.1%, 0.05%, or 0.01% of a theoretical ideal position of the inspection object 35 as measured in any given direction or angle about any given axis.

[0087] The method 2100 may be performed, at least in part, with a device or system 2200. The device or system 2200 may be a computer system. As shown in FIG. 22, the device or system 2200 may include at least one processor 2230 and a memory 2240 storing at least one program 2250 for execution by the at least one processor 2230. The at least one program 2250 may include instructions for the method 2100. As shown in FIG. 2 IB, the method 2100 may further include determining 2122, with the at least one processor 2230, at least one position of at least one of the inspection object 35, the vehicle 30, the transport system 10, the inspection system 20, the positioning device 100, and the offset (e.g., 435, 445, 915, 1615, and/or 1635). The method 2100 may further include determining 2124, with the at least one processor 2230, instructions for the adjusting 2130, with the positioning device 100, the third position of the inspection system 20 to reduce the offset (e.g., 435, 445, 915, 1615, and/or 1635) between the inspection system 20 and the inspection object 35. The method 2100 may further include transmitting 2126, with the at least one processor 2230, the instructions to at least one of the vehicle 30, the transport system 10, the inspection system 20, and the positioning device 100.

[0088] In some embodiments, the device or system 2200 can further comprise at least one input device 2210, which can be configured to send or receive information to or from any one from the group consisting of: an external device (not shown), the at least one processor 2230, the memory 2240, the non-transitory computer-readable storage medium 2260, and at least one output device 2270. The at least one input device 2210 can be configured to wirelessly send or receive information to or from the external device via a means for wireless communication, such as an input antenna 2220, a transceiver (not shown) or the like.

[0089] In some embodiments, the device or system 2200 can further comprise at least one output device 2270, which can be configured to send or receive information to or from any one from the group consisting of: an external device (not shown), the at least one input device 2210, the at least one processor 2230, the memory 2240, and the non-transitory computer-readable storage medium 2260. The at least one output device 2270 can be configured to wirelessly send or receive information to or from the external device via a means for wireless communication, such as an output antenna 2280, a transceiver (not shown) or the like.

[0090] FIG. 22 depicts a device or system 2200 comprising at least one processor 2230 and a memory 2240 storing at least one program 2250 for execution by the at least one processor 2230. In some embodiments, the device or system 2200 may further comprise a non-transitory computer- readable storage medium 2260 storing the at least one program 2250 for execution by the at least one processor 2230 of the device or system 2200. In some embodiments, the device or system 2200 may further comprise at least one input device 2210, which may be configured to send or receive information to or from any one from the group consisting of: an external device (not shown), the at least one processor 2230, the memory 2240, the non-transitory computer-readable storage medium 2260, and at least one output device 2270. The at least one input device 2210 may be configured to wirelessly send or receive information to or from the external device via a means for wireless communication, such as an antenna 2220, a transceiver (not shown) or the like.

[0091] In some embodiments, the device or system 2200 may further comprise at least one output device 2270, which may be configured to send or receive information to or from any one from the group consisting of: an external device (not shown), the at least one input device 2210, the at least one processor 2230, the memory 2240, and the non-transitory computer-readable storage medium 2260. The at least one output device 2270 may be configured to wirelessly send or receive information to or from the external device via a means for wireless communication, such as an antenna 2280, a transceiver (not shown) or the like.

[0092] In some embodiments, the device or system 2200 may be provided for inspecting an inspection object 35 of a vehicle 30 utilizing a transport system 10 for supporting and moving an inspection system 20. The inspection system 20 may include a positioning device 100 for offset (e.g., 435, 445, 915, 1615, 1635, and/or 1715) adjustment. The device or system 2200 may include at least one processor 2230; and memory 2240 coupled to the at least one processor 2230, the memory 2240 storing instructions to cause the at least one processor 2230 to perform operations including at least one portion of the method 2100 described above.

[0093] In some embodiments, a non-transitory computer program product 2260 may be provided for inspecting an inspection object 35 of a vehicle 30 utilizing a transport system 10 for supporting and moving an inspection system 20, the inspection system 20 including a positioning device 100 for offset (e.g., 435, 445, 915, 1615, 1635, and/or 1715) adjustment. The inspecting of the inspection object 35 may include at least one portion of the method 2100 described above. The non-transitory computer program product 2260, when executed by a processor 2230, may result in operations including at least one portion of the method 2100 described above.

[0094] The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the disclosure. As used herein, the singular forms “a”, “an” and “the” are intended to include the plural forms as well, unless the context clearly indicates otherwise. It will be further understood that the terms “comprises” and/or “comprising,” when used in this specification, specify the presence of stated features, integers, steps, operations, elements, and/or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and/or groups thereof. As used herein, the term “and/or” includes any and all combinations of one or more of the associated listed items.

[0095] Although at least one exemplary embodiment is described as using a plurality of units to perform the exemplary process, it is understood that the exemplary processes may also be performed by one or plurality of modules. Additionally, it is understood that the term controller/control unit may refer to a hardware device that includes a memory and a processor. The memory may be configured to store the modules and the processor may be specifically configured to execute said modules to perform one or more processes which are described further below.

[0096] The use of the terms “first”, “second”, “third” and so on, herein, are provided to identify various structures, dimensions or operations, without describing any order, and the structures, dimensions or operations may be executed in a different order from the stated order unless a specific order is definitely specified in the context.

[0097] Approximating language, as used herein throughout the specification and claims, may be applied to modify any quantitative representation that could permissibly vary without resulting in a change in the basic function to which it is related. Accordingly, a value modified by a term or terms, such as “about” and “substantially,” are not to be limited to the precise value specified. In at least some instances, the approximating language may correspond to the precision of an instrument for measuring the value. Here and throughout the specification and claims, range limitations may be combined and/or interchanged, such ranges are identified and include all the sub-ranges contained therein unless context or language indicates otherwise.

[0098] Unless specifically stated or obvious from context, as used herein, the term “about” is understood as within a range of normal tolerance in the art, for example within 2 standard deviations of the mean. “About” can be understood as within 10%, 9%, 8%, 7%, 6%, 5%, 4%, 3%, 2%, 1%, 0.5%, 0.1%, 0.05%, or 0.01% of the stated value. Unless otherwise clear from the context, all numerical values provided herein are modified by the term “about.”

[0099] Furthermore, control logic of the present disclosure may be embodied as non-transitory computer readable media on a computer readable medium containing executable program instructions executed by a processor, controller/control unit or the like. Examples of the computer readable mediums include, but are not limited to, ROM, RAM, compact disc (CD)-ROMs, magnetic tapes, floppy disks, flash drives, smart cards and optical data storage devices. The computer readable recording medium can also be distributed in network coupled computer systems so that the computer readable media is stored and executed in a distributed fashion, e.g., by a telematics server or a Controller Area Network (CAN).

[0100] One or more aspects or features of the subject matter described herein may be realized in digital electronic circuitry, integrated circuitry, specially designed application specific integrated circuits (ASICs), field programmable gate arrays (FPGAs) computer hardware, firmware, software, and/or combinations thereof. These various aspects or features may include embodiment in one or more computer programs that are executable and/or interpretable on a programmable system including at least one programmable processor, which may be special or general purpose, coupled to receive data and instructions from, and to transmit data and instructions to, a storage system, at least one input device, and at least one output device. The programmable system or computing system may include clients and servers. A client and server are substantially remote from each other and typically interact through a communication network. The relationship of client and server arises by virtue of computer programs running on the respective computers and having a client-server relationship to each other.

[0101] These computer programs, which may also be referred to as programs, software, software applications, applications, components, or code, include machine instructions for a programmable processor, and may be implemented in a high-level procedural language, an object-oriented programming language, a functional programming language, a logical programming language, and/or in assembly/machine language. As used herein, the term “machine-readable medium” refers to any computer program product, apparatus and/or device, such as for example magnetic discs, optical disks, memory, and Programmable Logic Devices (PLDs), used to provide machine instructions and/or data to a programmable processor, including a machine-readable medium that receives machine instructions as a machine-readable signal. The term “machine-readable signal” refers to any signal used to provide machine instructions and/or data to a programmable processor. The machine-readable medium may store such machine instructions non-transitorily, such as for example as would a non-transient solid-state memory or a magnetic hard drive or any equivalent storage medium. The machine-readable medium may alternatively or additionally store such machine instructions in a transient manner, such as for example as would a processor cache or other random access memory associated with one or more physical processor cores. [0102] To provide for interaction with a user, one or more aspects or features of the subject matter described herein may be implemented on a computer having a display device, such as for example a cathode ray tube (CRT) or a liquid crystal display (LCD) or a light emitting diode (LED) monitor for displaying information to the user and a keyboard and a pointing device, such as for example a mouse or a trackball, by which the user may provide input to the computer. Other kinds of devices may be used to provide for interaction with a user as well. For example, feedback provided to the user may be any form of sensory feedback, such as for example visual feedback, auditory feedback, or tactile feedback; and input from the user may be received in any form, including acoustic, speech, or tactile input. Other possible input devices include touch screens or other touch-sensitive devices such as single or multi-point resistive or capacitive trackpads, voice recognition hardware and software, optical scanners, optical pointers, digital image capture devices and associated interpretation software, and the like.

[0103] In the descriptions above and in the claims, phrases such as “at least one of’ or “one or more of’ may occur followed by a conjunctive list of elements or features. The term “and/or” may also occur in a list of two or more elements or features. Unless otherwise implicitly or explicitly contradicted by the context in which it is used, such a phrase is intended to mean any of the listed elements or features individually or any of the recited elements or features in combination with any of the other recited elements or features. For example, the phrases “at least one of A and B;” “one or more of A and B;” and “A and/or B” are each intended to mean “A alone, B alone, or A and B together.” A similar interpretation is also intended for lists including three or more items. For example, the phrases “at least one of A, B, and C;” “one or more of A, B, and C;” and “A, B, and/or C” are each intended to mean “A alone, B alone, C alone, A and B together, A and C together, B and C together, or A and B and C together.” In addition, use of the term “based on,” above and in the claims is intended to mean, “based at least in part on,” such that an unrecited feature or element is also permissible.

[0104] The subject matter described herein may be embodied in systems, apparatus, methods, and/or articles depending on the desired configuration. The embodiments set forth in the foregoing description, including the best mode, do not represent all embodiments consistent with the subject matter described herein. Instead, they are merely some examples consistent with aspects related to the described subject matter. Although a few variations have been described in detail above, other modifications or additions are possible. In particular, further features and/or variations may be provided in addition to those set forth herein. For example, the embodiments described above may be directed to various combinations and subcombinations of the disclosed features and/or combinations and subcombinations of several further features disclosed above. In addition, the logic flows depicted in the accompanying figures and/or described herein do not necessarily require the particular order shown, or sequential order, to achieve desirable results. Other embodiments may be within the scope of the following claims.