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Patent Searching and Data


Title:
TESTING SOCKET AND CONDUCTIVE PARTICLES
Document Type and Number:
WIPO Patent Application WO/2017/196092
Kind Code:
A1
Abstract:
The present invention relates to a testing socket, more specifically to a testing socket which is placed between a device to be tested and a testing apparatus to electrically connect a terminal of the former and a pad of the latter. The testing socket comprises: a plurality of conductive parts distanced from each other in the planar direction at each location corresponding to a terminal of a device to be tested, and having a plurality of conductive particles arrayed in the width-wise direction in flexible insulating material; and insulating support parts, placed between the plurality of conductive parts distanced from each other, for supporting each conductive part and insulating same in the planar direction, wherein each conductive particle comprises: a columnar trunk part; and two or more protrusions protruding from the top end of the trunk part, wherein between the adjacent protrusions is a groove which is recessed toward the trunk, and the angle between the opposing inner surfaces of the adjacent protrusions is an acute angle of less than 90°.

Inventors:
CHUNG, Young Bae (B-6F, 215 Galmachi-ro,Jungwon-gu, Seongnam-si, Gyeonggi-do, 13217, KR)
Application Number:
KR2017/004870
Publication Date:
November 16, 2017
Filing Date:
May 11, 2017
Export Citation:
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Assignee:
ISC CO., LTD. (6F 215, Galmachi-roJungwon-gu, Seongnam-si, Gyeonggi-do, 13217, KR)
International Classes:
G01R1/04; G01R3/00; G01R31/28; H01B5/14; H01B5/16
Foreign References:
KR101525520B12015-06-03
KR101339166B12013-12-09
KR20090071312A2009-07-01
KR20050094478A2005-09-27
KR20060006282A2006-01-19
Attorney, Agent or Firm:
Y.P.LEE, MOCK & PARTNERS (12F Daelim Acrotel, 13 Eonju-ro 30-gilGangnam-gu, Seoul, 06292, KR)
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