Title:
TESTING SYSTEM CONTROL DEVICE
Document Type and Number:
WIPO Patent Application WO/2019/163277
Kind Code:
A1
Abstract:
The purpose of the present invention is to provide a testing system control device capable of, even if a specimen is replaced with a new specimen, quickly starting testing using a resonance suppression controller corresponding to the mechanical characteristics of the new specimen. This overall control device 1 for a testing system comprises: a plurality of resonance suppression controllers 32_1, …, 32_n that each generate a torque current command signal for suppressing mechanical resonance between a specimen W and a dynamometer D upon receiving a base torque current command signal and axial torque detection signal and have different input/output characteristics; a specimen characteristic acquisition unit 51 for acquiring the value of the moment of inertia of the specimen W connected to the dynamometer D; and a resonance-suppression-controller selection unit 52 for selecting one of the plurality of resonance suppression controllers 32_1, …, 32_n on the basis of the value of the moment of inertia acquired by the specimen characteristic acquisition unit 51 and mounting the selected resonance suppression controller 32_i in a dynamometer control module 3.
Inventors:
KANKE MASAYASU (JP)
AKIYAMA TAKAO (JP)
AKIYAMA TAKAO (JP)
Application Number:
PCT/JP2018/046843
Publication Date:
August 29, 2019
Filing Date:
December 19, 2018
Export Citation:
Assignee:
MEIDENSHA ELECTRIC MFG CO LTD (JP)
International Classes:
G01M15/02
Foreign References:
JP3757839B2 | 2006-03-22 | |||
JPH05215643A | 1993-08-24 | |||
JP2014142317A | 2014-08-07 | |||
JP6044647B2 | 2016-12-14 | |||
JP4023195B2 | 2007-12-19 | |||
JP5136247B2 | 2013-02-06 |
Attorney, Agent or Firm:
SHOBAYASHI Masayuki et al. (JP)
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