Title:
THERMAL ANALYSIS APPARATUS
Document Type and Number:
WIPO Patent Application WO/2017/033526
Kind Code:
A1
Abstract:
This thermal analysis apparatus is provided with a sample changer 40 that performs automatic changing of sample containers 13a, 13b. An imaging device 50 is attached to an outer frame 30 of a heating furnace 20 through a mounting part 51, and this imaging device 50 is used to visually observe a sample through an opening 24 formed in the heating furnace 20. The imaging device 50 is movable from the vicinity of a measurement position together with the heating furnace 20. The vicinity of the measurement position can thus be made open to allow the sample changer 40 to place the sample containers 13a, 13b at the measurement position and remove the sample containers 13a, 13b from the measurement position without obstruction.
Inventors:
TANAKA NOBUHIRO (JP)
NORITAKE KOICHIRO (JP)
NORITAKE KOICHIRO (JP)
Application Number:
PCT/JP2016/067019
Publication Date:
March 02, 2017
Filing Date:
June 08, 2016
Export Citation:
Assignee:
RIGAKU DENKI CO LTD (JP)
International Classes:
G01N25/00; G01N5/04; G01N25/20
Foreign References:
| JP2015108540A | 2015-06-11 | |||
| JP2006349545A | 2006-12-28 | |||
| JPS59142696U | 1984-09-22 | |||
| JP2011053077A | 2011-03-17 | |||
| JP2006029650A | 2006-02-02 | |||
| JPH08327573A | 1996-12-13 | |||
| JP2013185834A | 2013-09-19 |
Attorney, Agent or Firm:
YAMAMOTO, Toshitake (JP)
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