Title:
THERMAL INSULATION PERFORMANCE MEASUREMENT APPARATUS AND MEASUREMENT METHOD USING THE SAME
Document Type and Number:
WIPO Patent Application WO/2013/115592
Kind Code:
A1
Abstract:
A thermal insulation performance measurement apparatus which measures thermal insulation performance of a thermal insulator by heat flux to the thermal insulator, measured by a heat flux sensor, and a measurement method using the same includes a heat flux sensor provided with one surface adapted to contact an object to be measured, a first heat source arranged on the upper surface of the heat flux sensor to supply heat to the heat flux sensor, a thermal insulator arranged on the upper surface of the first heat source, a third heat source arranged on the upper surface of the thermal insulator, and a second heat source arranged around the heat flux sensor.
Inventors:
KWON JAE SUNG (KR)
KIM HYUNG SUNG (KR)
PARK JONG SUNG (KR)
JUNG YOUNG SUNG (KR)
KIM HYUNG SUNG (KR)
PARK JONG SUNG (KR)
JUNG YOUNG SUNG (KR)
Application Number:
PCT/KR2013/000825
Publication Date:
August 08, 2013
Filing Date:
February 01, 2013
Export Citation:
Assignee:
SAMSUNG ELECTRONICS CO LTD (KR)
International Classes:
G01N25/18
Foreign References:
| US4117712A | 1978-10-03 | |||
| JP2009281910A | 2009-12-03 | |||
| JP2008286720A | 2008-11-27 | |||
| US7318671B1 | 2008-01-15 | |||
| KR20110051792A | 2011-05-18 |
Attorney, Agent or Firm:
SELIM INTELLECTUAL PROPERTY LAW FIRM (Seolim Bldg. 115, Teheran-ro,,Gangnam-gu, Seoul 135-912, KR)
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Claims: