THERMAL PROJECTION DEVICE

WIPO Patent Application WO2003072290

A3

The invention relates to a device and a method for control of the operation of a thermal projection torch (12), characterised in that the characteristics of the jet (16) and the temperature of the deposit (24) on the piece (22) are measured by means of a camera (54) and a combined pyrometer (70). The correction to be made to the supply parameters of the torch (12) are deduced therefrom and the corrected parameters are transmitted to the unit (30) controlling the torch (12).

JP6714436	Liquid processing equipment and liquid processing method
JP2023042055	MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE AND ATMOSPHERIC PRESSURE PLASMA DEVICE
JPS5942229	[Title of the device] Structure of a plasma electrode

VARDELLE MICHEL (FR)
RENAULT THIERRY (US)
BOSSOUTROT CEDRIC (FR)
BRAILLARD FREDERIC (FR)
HOFFMANN HAKIM (FR)

PCT/FR2003/000647

May 06, 2004

February 28, 2003

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SNECMA SERVICES (FR)
VARDELLE MICHEL (FR)
RENAULT THIERRY (US)
BOSSOUTROT CEDRIC (FR)
BRAILLARD FREDERIC (FR)
HOFFMANN HAKIM (FR)

H05H1/26; B05B7/20; B05B7/22; B23K10/00; C23C4/00; C23C4/12; (IPC1-7): B23K10/00

USRE36926E

2000-10-31

CHEN ET AL.: "intelligent methodology for sensing, modeling and control of pulsed gtaw: part I - bead-on-plate welding", WELDING RESEARCH, June 2000 (2000-06-01), pages 151s - 163s, XP000954653
PATENT ABSTRACTS OF JAPAN vol. 015, no. 138 (M - 1100) 8 April 1991 (1991-04-08)
PATENT ABSTRACTS OF JAPAN vol. 1998, no. 11 30 September 1998 (1998-09-30)
DOUMANIDIS ET AL.: "distributed-parameter control of the heat source trajectory in thermal materials processing", JOURNAL OF MANUFACTURING SCIENCE AND ENGINEERING, vol. 118, November 1996 (1996-11-01), pages 571 - 578, XP000635785

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