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Title:
THERMAL-RESPONSIVENESS MEASUREMENT METHOD FOR THIN-FILM SHAPED RAW MATERIAL AND THIN-FILM FILM THICKNESS MEASUREMENT DEVICE
Document Type and Number:
WIPO Patent Application WO/2012/161287
Kind Code:
A1
Abstract:
The present invention provides a means for measuring various thermal properties of a thin film comprising a polymer material. A thermal-responsiveness measurement method pertaining to this invention is characterized by including: a step in which a thin-film film thickness measurement device is used and data relating to the film thickness of a thin film to be analyzed is measured at at least two temperatures, for a sensor chip (a sensor chip to be analyzed) having the thin film to be analyzed formed on the surface thereof; and a step (a film thickness calculation step) in which changes in film thickness relative to the temperature of the thin film to be analyzed are calculated. The use of the thin-film film thickness measurement device comprising a program temperature adjustment means for measuring thermal responsiveness, for the thin film to be analyzed formed on the surface of the sensor chip, is desirable in order to provide this kind of thermal-responsiveness measurement method.

Inventors:
NINOMIYA, Hidetaka (INC. 1, Sakura-machi, Hino-sh, Tokyo 11, 〒1918511, JP)
二宮 英隆 (〒11 東京都日野市さくら町1番地 コニカミノルタテクノロジーセンター株式会社内 Tokyo, 〒1918511, JP)
MURAYAMA, Takanori (INC. 1, Sakura-machi, Hino-sh, Tokyo 11, 〒1918511, JP)
村山 貴紀 (〒11 東京都日野市さくら町1番地 コニカミノルタテクノロジーセンター株式会社内 Tokyo, 〒1918511, JP)
KASHIWAZAKI, Osamu (INC. 1, Sakura-machi, Hino-sh, Tokyo 11, 〒1918511, JP)
Application Number:
JP2012/063396
Publication Date:
November 29, 2012
Filing Date:
May 24, 2012
Export Citation:
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Assignee:
KONICA MINOLTA ADVANCED LAYERS, INC. (2970, Ishikawa-machi Hachioji-sh, Tokyo 05, 〒1928505, JP)
コニカミノルタアドバンストレイヤー株式会社 (〒05 東京都八王子市石川町2970番地 Tokyo, 〒1928505, JP)
NINOMIYA, Hidetaka (INC. 1, Sakura-machi, Hino-sh, Tokyo 11, 〒1918511, JP)
二宮 英隆 (〒11 東京都日野市さくら町1番地 コニカミノルタテクノロジーセンター株式会社内 Tokyo, 〒1918511, JP)
MURAYAMA, Takanori (INC. 1, Sakura-machi, Hino-sh, Tokyo 11, 〒1918511, JP)
村山 貴紀 (〒11 東京都日野市さくら町1番地 コニカミノルタテクノロジーセンター株式会社内 Tokyo, 〒1918511, JP)
International Classes:
G01N25/16; G01B11/06; G01N21/21; G01N21/27
Foreign References:
JP2009042038A
JP3786073B2
JP2009079938A
JP2010503854A
Other References:
TAKATOSHI KINOSHITA: 'Evaluation of Polymer-gas Interaction via the Application of Interference Color and QCM Measurement' JOURNAL OF THE JAPAN SOCIETY OF COLOUR MATERIAL vol. 80, no. 5, 20 May 2007, pages 205 - 209
Attorney, Agent or Firm:
SSINPAT PATENT FIRM (Gotanda Yamazaki Bldg. 6F, 13-6 Nishigotanda 7-chome, Shinagawa-k, Tokyo 31, 〒1410031, JP)
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Claims: