Title:
THICKNESS DETECTION DEVICE
Document Type and Number:
WIPO Patent Application WO/2012/005226
Kind Code:
A1
Abstract:
The disclosed thickness detection device can accurately detect the thickness of a target object in a short time. Banded light (25) is irradiated at an angle in the movement direction along a mount member (11) and an image is generated from the reflected light. A thickness detection device (100) that detects the thickness of a product by detecting phase shifts is provided with: a filtering means (4) that acquires an image of the target object (10) from among images acquired by a line sensor (21) through the difference between the brightness value of the mount member (11) and the brightness value of the target object (10); a phase of a region (A1) of the target object (10) acquired through the filtering means (4); and a phase difference calculation means (5) that requests the phase difference in the phase of the banded light (25) that irradiates the mounting member (11). On the basis of the phase difference requested by the phase difference calculation means (5), the quality of the target object is determined.
Inventors:
SASAI Masatoshi (Takeda Fushimi-ku, Kyoto-cit, Kyoto 14, 〒6128414, JP)
Application Number:
JP2011/065311
Publication Date:
January 12, 2012
Filing Date:
July 04, 2011
Export Citation:
Assignee:
MEGA TRADE CORP. (Dangawara-cho 5, Takeda Fushimi-ku, Kyoto-cit, Kyoto 14, 〒6128414, JP)
株式会社メガトレード (〒14 京都府京都市伏見区竹田段川原町５ Kyoto, 〒6128414, JP)
株式会社メガトレード (〒14 京都府京都市伏見区竹田段川原町５ Kyoto, 〒6128414, JP)
International Classes:
G01B11/06
Attorney, Agent or Firm:
KURU Toru (550-2, Honeyano-cho Rokkaku-sagaru, Tominokoji-dori, Nakagyo-ku, Kyoto-sh, Kyoto 64, 〒6048064, JP)
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