Title:
THIN FILM MEASUREMENT TECHNIQUE
Document Type and Number:
WIPO Patent Application WO/2010/077407
Kind Code:
A3
Abstract:
A thin film measurement technique is disclosed. The thin film measurement technique comprises radioisotopes, radiation detectors, mechanical hardware, electronics and/or circuitry, wires, cables, connectors, measurement software, and a computer. One aspect of the thin film measurement technique pertains to measurement sensors, which measure radiation emerging from material surfaces. Another aspect of the disclosure pertains to mechanical hardware that enables the thin film measurement to be made. Another aspect of the disclosure pertains to filter housings. Another aspect of the disclosure pertains to measurement software, for quantifying the measurement from the sensor, and/or controlling and optimizing processes based on said measurements. Another aspect of the disclosure pertains to hardware and equipment utilizing the thin film measurement technique. All aspects can be utilized alone or in combination with one another.
Inventors:
HARRISON SOREN (US)
Application Number:
PCT/US2009/059989
Publication Date:
September 16, 2010
Filing Date:
October 08, 2009
Export Citation:
Assignee:
FUSION RES TECHNOLOGIES LLC (US)
HARRISON SOREN (US)
HARRISON SOREN (US)
International Classes:
G01N23/20; G01B15/00; G01N23/207
Foreign References:
| US4698832A | 1987-10-06 | |||
| US4574387A | 1986-03-04 | |||
| US5029337A | 1991-07-02 |
Attorney, Agent or Firm:
LEONARDO, Mark, S. et al. (One Financial CenterBoston, MA, US)
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