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Title:
THIRD-GENERATION SEQUENCING DATA ANALYSIS METHOD AND DEVICE FOR POINT MUTATION DETECTION
Document Type and Number:
WIPO Patent Application WO/2023/124779
Kind Code:
A1
Abstract:
The present application provides a third-generation sequencing data analysis method and device for point mutation detection. The analysis method of the present application comprises: 1) extracting a first sequence subset containing a point mutation to undergo detection; 2) extracting seed sequences from the first sequence subset to obtain a second sequence subset; 3) obtaining an original data set having a desired quality; 4) using seed sequence pairs of the second sequence subset to obtain N data sets containing a target sequence; 5) performing point mutation detection and analysis on the N data sets containing the target sequence; 6) allocating a weight W to each point mutation result in N detection results; and 7) calculating a point mutation result and a frequency thereof according to a formula.

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Inventors:
LANG JIDONG (CN)
SUN JIGUO (CN)
Application Number:
PCT/CN2022/136275
Publication Date:
July 06, 2023
Filing Date:
December 02, 2022
Export Citation:
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Assignee:
QITAN TECH LTD CHENGDU (CN)
International Classes:
G16B30/10
Foreign References:
CN114005489A2022-02-01
CN109295198A2019-02-01
CN111139291A2020-05-12
CN111243663A2020-06-05
US20200082911A12020-03-12
Attorney, Agent or Firm:
BEIJING EAST IP LTD. (CN)
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