Title:
THREE-DIMENSIONAL MEASUREMENT APPARATUS, AND THREE-DIMENSIONAL MEASUREMENT METHOD
Document Type and Number:
WIPO Patent Application WO/2013/187203
Kind Code:
A1
Abstract:
A lattice is shifted and projected several times from projectors onto an object to be measured, the object to be measured having the lattice projected thereon is imaged by cameras, and conversion into a three-dimensional shape of the object to be measured is performed. A projector is provided at a position near to the cameras, and a projector is provided at a position far from the cameras. A phase obtained from images acquired during projection from the projector at the position near to the cameras is used to convert, into a phase uniquely expressing a position along the light-of-sight direction from the cameras, a phase obtained from images acquired during projection from the projector at the position far from the cameras. As a result, the three-dimensional shape of an object can be accurately measured in a short period of time.
Inventors:
IWAI KAZUTAKA (JP)
Application Number:
PCT/JP2013/064277
Publication Date:
December 19, 2013
Filing Date:
May 22, 2013
Export Citation:
Assignee:
SHIMA SEIKI MFG (JP)
International Classes:
G01B11/25
Domestic Patent References:
| WO2011145285A1 | 2011-11-24 |
Foreign References:
| JP2010276607A | 2010-12-09 | |||
| JPS61175511A | 1986-08-07 | |||
| JP3536097B2 | 2004-06-07 | |||
| JP3500430B2 | 2004-02-23 | |||
| JP4170875B2 | 2008-10-22 |
Other References:
See also references of EP 2860490A4
Attorney, Agent or Firm:
SHIOIRI Akira et al. (JP)
Akira Shioiri (JP)
Akira Shioiri (JP)
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