Title:
THREE-DIMENSIONAL MEASUREMENT SYSTEM AND THREE-DIMENSIONAL MEASUREMENT METHOD
Document Type and Number:
WIPO Patent Application WO/2018/061900
Kind Code:
A1
Abstract:
Provided is a three-dimensional measurement system that makes it possible to have error at an extremely small value. A three-dimensional measurement system 1 is provided with a three-dimensional laser scanner 2, and targets 3, 3 that are installed at at least two known coordinate points observed by the three-dimensional laser scanner 2, the targets 3, 3 being mounted on a leveling stand 4 having a circular bubble level 41 and a cylindrical bubble level 42. In addition, a three-dimensional measurement method using the three-dimensional measurement system 1 comprises a step for installing the targets 3, 3 so that the distance between the three-dimensional laser scanner 2 and each of the two targets 3, 3 will be from 10 to 120 m respectively, and so that internal angle formed by the three-dimensional laser scanner 2 and each of the two targets 3, 3 will be from 30° to 150°respectively.
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Inventors:
OTAKI MITSUJI (JP)
Application Number:
PCT/JP2017/033819
Publication Date:
April 05, 2018
Filing Date:
September 20, 2017
Export Citation:
Assignee:
TOPRISE CO LTD (JP)
International Classes:
G01C15/00; G01C15/06
Foreign References:
| JP2015087319A | 2015-05-07 | |||
| JPH04155212A | 1992-05-28 | |||
| JPH08114452A | 1996-05-07 | |||
| JP2002031529A | 2002-01-31 | |||
| JP2013190272A | 2013-09-26 | |||
| US20150098075A1 | 2015-04-09 |
Attorney, Agent or Firm:
PATENTBOX IP LAW FIRM (JP)
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