Title:
THREE-DIMENSIONAL MEASUREMENT TECHNOLOGY-BASED SYSTEM AND METHOD FOR MEASURING SURFACE AREA OF OBJECT
Document Type and Number:
WIPO Patent Application WO/2018/049818
Kind Code:
A1
Abstract:
A three-dimensional measurement technology-based system for measuring the surface area of an object, said system comprising three parts, namely a three-dimensional measurement and surface area calculation sub-system (a1, b2), a control sub-system (3) and a mechanical mechanism sub-system (4). The surface area of an object is accurately measured via object surface three-dimensional data reconstruction, a series of rapid process flows are designed, a plurality of objects to be measured can be scanned simultaneously, and a plurality of three-dimensional measurement systems are used to support simultaneous omnidirectional three-dimensional data acquisition, pipeline operations, three-dimensional measurement data one-click optimisation and one-click measurement report exporting. The system is simple in operation, performs measurement tasks in a rapid and accurate manner, and significantly speeds up the process of detecting and measuring the surface area of an object.
Inventors:
LIU JIAPENG (CN)
Application Number:
PCT/CN2017/081560
Publication Date:
March 22, 2018
Filing Date:
April 24, 2017
Export Citation:
Assignee:
SHANGHAI X IMAGING INFO & TECH CO LTD (CN)
International Classes:
G01B11/28
Foreign References:
| CN206073939U | 2017-04-05 | |||
| CN104165587A | 2014-11-26 | |||
| CN103307978A | 2013-09-18 | |||
| CN105674908A | 2016-06-15 |
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