Title:
TIME-OF-FLIGHT MASS SPECTROMETER
Document Type and Number:
WIPO Patent Application WO/2019/211886
Kind Code:
A1
Abstract:
According to the present invention, during MS/MS analysis, a collision energy (CE) greater than that for ordinary MS analysis is imparted to ions which are then introduced into a collision cell (13) where the ions are dissociated. Then, mass analysis is conducted by introducing the resultant product ions into an orthogonal accelerator (17) of an OA-TOFMS. The ions subject to mass analysis are temporarily accumulated in the interior space of an ion guide (14) by means of a potential barrier formed as a result of applying voltage to an exit-side gate electrode (132), while a control unit (30) controls a voltage generation unit (33) such that the potential barrier becomes increasingly higher with increase in CE. Even in the case when the CE is high, ions do not get past the potential barrier and are ensured to be accumulated in the interior space of the ion guide (14). Meanwhile, in the case when the CE is low, ions accumulate in clusters on the exit side of the ion guide (14), thereby resulting in an enhanced ion compression effect. With this configuration, it is possible to achieve an improved duty cycle and an enhanced ion detection sensitivity.
Inventors:
OSHIRO TOMOYUKI (JP)
Application Number:
PCT/JP2018/017386
Publication Date:
November 07, 2019
Filing Date:
May 01, 2018
Export Citation:
Assignee:
SHIMADZU CORP (JP)
International Classes:
H01J49/40
Domestic Patent References:
| WO2016042632A1 | 2016-03-24 |
Attorney, Agent or Firm:
KYOTO INTERNATIONAL PATENT LAW OFFICE (JP)
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