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Title:
TIME-OF-FLIGHT MEASUREMENT-TYPE MASS SPECTROMETER DEVICE AND METHOD
Document Type and Number:
WIPO Patent Application WO/2017/150528
Kind Code:
A1
Abstract:
A time-of-flight measurement-type mass-measuring device for accelerating ions stored in a first ion trap and introducing the ions into a flight tube to measure time-of-fight and thereby measure the mass of the ions, wherein the device is provided with: a second ion trap that is capable of storing ions to be measured and introducing the ions into the first ion trap; and a third ion trap that is capable of storing reference ions and introducing the reference ions into the first ion trap. The device is furthermore preferably provided with a control means for alternately performing in a prescribed pattern (e.g., once each): (1) introduction of the ions to be measured from the second ion trap to the first ion trap, and time-of-flight measurement of the ions to be measured; and (2) introduction of the reference ions from the third ion trap to the first ion trap, and time-of-flight measurement of the reference ions.

Inventors:
WADA, Michiharu (2-1 Hirosawa, Wako-sh, Saitama 98, 〒3510198, JP)
SCHURY, Peter (2-1 Hirosawa, Wako-sh, Saitama 98, 〒3510198, JP)
ITO, Yuta (2-1 Hirosawa, Wako-sh, Saitama 98, 〒3510198, JP)
WOLLNIK, Hermann (2-1 Hirosawa, Wako-sh, Saitama 98, 〒3510198, JP)
Application Number:
JP2017/007769
Publication Date:
September 08, 2017
Filing Date:
February 28, 2017
Export Citation:
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Assignee:
RIKEN (2-1 Hirosawa, Wako-shi Saitama, 98, 〒3510198, JP)
International Classes:
H01J49/40; G01N27/62; H01J49/06
Domestic Patent References:
WO2014195734A12014-12-11
Foreign References:
JPS619952U1986-01-21
Other References:
SCHURY, P ET AL.: "A high-resolution multi-reflection time-of-flight mass spectrograph for precision mass measurements at RIKEN/SLOWRI", NUCLEAR INSTRUMENTS AND METHODS IN PHYSICS RESEARCH B, vol. 335, 19 June 2014 (2014-06-19), pages 39 - 53, XP029014415, DOI: doi:10.1016/j.nimb.2014.05.016
Attorney, Agent or Firm:
SANUKI, Shinichi et al. (Acropolis 21 Bldg. 8th Floor, 4-10 Higashi Nihonbashi 3-chome, Chuo-k, Tokyo 04, 〒1030004, JP)
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