Title:
TIME-OF-FLIGHT TYPE MASS SPECTROMETRY DEVICE
Document Type and Number:
WIPO Patent Application WO/2016/021056
Kind Code:
A1
Abstract:
In this invention, the ions to be measured are temporarily retained and cooled in a linear ion guide containing an ion guide (14), and then the ions are emitted toward a beam slicer (15). The direct current voltage applied to the beam slicer (15) is varied over time so that: an acceleration electric field is formed in a first region (P1), such that, when the ions pass through the first region (P1), the later the ion, the greater the energy imparted thereon; and an electric field is formed in a second region (P2), such that, when the ions pass through the second region (P2), the ions passing first are decelerated, and the more delayed the ion becomes, the greater the energy imparted thereon. The ions having a large m/z, which are imparted with large energies in the first region (P1), have high velocities, and therefore pass in front of ions having a small m/z, inside the beam slicer (15). Imparted with large energies in the second region (P2), the ions having a small m/z have increased velocities and catch up with the ions having a large m/z at the entrance of an orthogonal acceleration unit (17). In this manner, since the various ions do not spread in the axis (C) direction upon acceleration by the orthogonal acceleration unit (17), and since the energies also become approximately even, high precision, high sensitivity measurements of a broad range of m/z can be accomplished.
Inventors:
OKUMURA DAISUKE (JP)
Application Number:
PCT/JP2014/071056
Publication Date:
February 11, 2016
Filing Date:
August 08, 2014
Export Citation:
Assignee:
SHIMADZU CORP (JP)
International Classes:
H01J49/40; H01J49/06; H01J49/42
Foreign References:
| JP2003123685A | 2003-04-25 | |||
| JP2002260573A | 2002-09-13 | |||
| JP2008108739A | 2008-05-08 | |||
| JP2014059966A | 2014-04-03 |
Attorney, Agent or Firm:
Kyoto International Patent Law Office (JP)
Patent business corporation Kyoto international patent firm (JP)
Patent business corporation Kyoto international patent firm (JP)
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