Title:
TIRE INSPECTION DEVICE
Document Type and Number:
WIPO Patent Application WO/2007/145245
Kind Code:
A1
Abstract:
A tire inspection device generates an analyzing wavelet for wavelet conversion
correlating a time and a frequency corresponding to a tire surface position according
to a frequency representing a characteristic portion of a predetermined tire
surface structure. After this, the tire inspection device generates and stores
an integer numeric filter from the created analyzing wavelet, detects the tire
surface structure, subjects the detection signal obtained by the detection
to a wavelet conversion by using the numeric filter as the analyzing wavelet,
and outputs the conversion result as characteristic information indicating
the characteristic portion.
Inventors:
FUJISAWA YOSHITAKA (JP)
Application Number:
PCT/JP2007/061899
Publication Date:
December 21, 2007
Filing Date:
June 13, 2007
Export Citation:
Assignee:
BRIDGESTONE CORP (JP)
FUJISAWA YOSHITAKA (JP)
FUJISAWA YOSHITAKA (JP)
International Classes:
G01B11/00; B60C19/00; G01B11/30; G01M17/02; G01N21/84; G01N21/88
Foreign References:
| JPH10160453A | 1998-06-19 | |||
| JP2000046893A | 2000-02-18 | |||
| JPH08329046A | 1996-12-13 | |||
| JP2001016588A | 2001-01-19 | |||
| JP2003264704A | 2003-09-19 | |||
| JPH10106453A | 1998-04-24 |
Other References:
See also references of EP 2034268A4
Attorney, Agent or Firm:
NAKAJIMA, Jun et al. (NAKAJIMA & KATOSeventh Floor, HK-Shinjuku Bldg.,3-17, Shinjuku 4-chom, Shinjuku-ku Tokyo, JP)
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