Title:
TIRE INSPECTION DEVICE
Document Type and Number:
WIPO Patent Application WO/2010/131698
Kind Code:
A1
Abstract:
Provided is a tire inspection device whereby during, for example, appearance inspection of the inner and our surfaces of a tire, images of the tire are efficiently taken, thereby reducing the processing time required for inspection and making it possible to accurately synthesize images taken. The aforementioned tire inspection device is so arranged that a plurality of cameras (11) to (13) are located at relatively displaced circumferential positions and are set in such a way that image taking positions are different tire-width-wise, and that relevant images of the tire inner circumferential surface which are obtained by being taken by the aforementioned cameras are synthesized, thereby conducting inspection. In the aforementioned tire inspection device, the following operations are performed: A tire is rotated circumferentially in such a way as to be relative to the plurality of cameras (11) to (13), and image taking operations are executed by all of the cameras (11) to (13); during these operations, markers are inserted at the same time into images taken by all of the cameras (11) to (13); images taken by all of the cameras (11) to (13) are synthesized; during this operation, these markers are used as reference positions of relevant images taken, and images taken are aligned commensurate with circumferential relative displacement amounts among the cameras (11) to (13).
Inventors:
FUJISAWA Yoshitaka (1-1 Ogawahigashi-cho 3-chom, Kodaira-shi Tokyo 31, 〒1878531, JP)
Application Number:
JP2010/058086
Publication Date:
November 18, 2010
Filing Date:
May 13, 2010
Export Citation:
Assignee:
KABUSHIKI KAISHA BRIDGESTONE (10-1, Kyobashi 1-chome Chuo-k, Tokyo 40, 〒1048340, JP)
株式会社ブリヂストン (〒40 東京都中央区京橋１－１０－１ Tokyo, 〒1048340, JP)
株式会社ブリヂストン (〒40 東京都中央区京橋１－１０－１ Tokyo, 〒1048340, JP)
International Classes:
G01N21/954; B60C19/00; G01B11/30; G01N21/952
Attorney, Agent or Firm:
MIYAZONO Junichi et al. (6th Fl, Fifth Tanaka Bldg. 4-4, Iidabashi 3-chom, Chiyoda-ku Tokyo 72, 〒1020072, JP)
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Claims: