Title:
TRANSIENT THERMAL CHARACTERISTIC ANALYSIS DEVICE, ANALYSIS METHOD, AND PROGRAM
Document Type and Number:
WIPO Patent Application WO/2021/006288
Kind Code:
A1
Abstract:
A transient thermal characteristic analysis device (1) analyzes transient thermal characteristics of a power module (40) on the basis of time-sequential data which is junction temperatures sampled at an equal linear time interval in a heat radiation process of the power module (40). The transient thermal characteristic analysis device (1) is provided with: a conversion processing unit (131) that re-samples the time-sequential data at unequal intervals, converts the time-sequential data into logarithmic time, and executes numerical differentiation on the converted time-sequential data; a conversion processing unit (131) that executes unequal interval Fourier transformation on the numerically differentiated time-sequential data; and a noise removal unit (132) that carries out a noise removal process in a frequency region for the Fourier transformed time-sequential data. Accordingly, the transient thermal characteristics of the power module is analyzed more accurately.
Inventors:
FUKUNAGA SHUHEI (JP)
FUNAKI TSUYOSHI (JP)
KATO FUMIKI (JP)
FUNAKI TSUYOSHI (JP)
KATO FUMIKI (JP)
Application Number:
PCT/JP2020/026665
Publication Date:
January 14, 2021
Filing Date:
July 08, 2020
Export Citation:
Assignee:
UNIV OSAKA (JP)
International Classes:
G01N25/18; G01R31/26
Foreign References:
| JP2019015564A | 2019-01-31 | |||
| JP2003194755A | 2003-07-09 | |||
| CN104569065A | 2015-04-29 | |||
| US20140079092A1 | 2014-03-20 |
Attorney, Agent or Firm:
KAEDE PATENT ATTORNEYS' OFFICE (JP)
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