Title:
TRANSISTOR SIMULATION SYSTEM AND METHOD
Document Type and Number:
WIPO Patent Application WO/2017/049903
Kind Code:
A1
Abstract:
A transistor simulation system comprises a transistor measuring device configured to measure a transistor to be measured by means of network and output operating parameters, and a transistor simulation device configured to use the operating parameters to conduct the transistor simulation design.
Inventors:
SUN HAN (CN)
LI CHUNYANG (CN)
LI CHUNYANG (CN)
Application Number:
PCT/CN2016/080922
Publication Date:
March 30, 2017
Filing Date:
May 03, 2016
Export Citation:
Assignee:
ZTE CORP (CN)
International Classes:
G06F17/50
Foreign References:
CN101976293A | 2011-02-16 | |||
CN104142436A | 2014-11-12 | |||
CN101169800A | 2008-04-30 | |||
CN104316544A | 2015-01-28 | |||
CN104378085A | 2015-02-25 |
Attorney, Agent or Firm:
AFD CHINA INTELLECTUAL PROPERTY LAW OFFICE (CN)
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