Title:
TRANSMISSION TARGET FOR AN OPEN X-RAY TUBE, OPEN X-RAY TUBE, METHOD FOR DETECTING A TRANSMISSION TARGET, AND METHOD FOR ADJUSTING THE CHARACTERISTICS OF SAID TRANSMISSION TARGET
Document Type and Number:
WIPO Patent Application WO/2019/141454
Kind Code:
A3
Abstract:
The invention relates to a transmission target for an open x-ray tube, in particular an open microfocus x-ray tube, having a carrier layer (1) made of a carrier material and a target layer (2) made from a target material, wherein an identification material (9) is applied to the carrier layer (1), in the mounted state of the transmission target on the side facing the electron source of the x-ray tube, in an identification region (10) of the carrier layer (1). The invention also relates to an open x-ray tube, in particular an open microfocus x-ray tube, having a transmission target which has a target layer (2) and the carrier layer (1) is connected to a target current measuring device (5), and having an electron capture sleeve (3), which is electrically insulated from the transmission target and is connected to a backscattered electron current measuring device (4). The invention further relates to two methods for detecting a specific transmission target which is incorporated into an x-ray tube according to the invention. The invention also relates to another method for automatically adjusting the characteristics of a transmission target according to the invention in a x-ray tube according to the invention.
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Inventors:
SCHU ANDRÉ (DE)
THIEL FABIAN (DE)
THIEL FABIAN (DE)
Application Number:
PCT/EP2018/085095
Publication Date:
September 12, 2019
Filing Date:
December 17, 2018
Export Citation:
Assignee:
YXLON INT GMBH (DE)
International Classes:
H01J35/08
Foreign References:
| EP3059755A1 | 2016-08-24 | |||
| EP2763156A1 | 2014-08-06 | |||
| JPH06188092A | 1994-07-08 | |||
| US20050123097A1 | 2005-06-09 |
Other References:
WILSON D J ET AL: "Film thickness and composition determination for binary alloys using backscattered electrons", THIN SOLID FILMS, ELSEVIER, AMSTERDAM, NL, vol. 165, no. 1, 15 November 1988 (1988-11-15), pages 217 - 225, XP025852312, ISSN: 0040-6090, [retrieved on 19881115], DOI: 10.1016/0040-6090(88)90692-X
IHSAN ET AL: "Optimization of X-ray target parameters for a high-brightness microfocus X-ray tube", NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION B: BEAM INTERACTIONS WITH MATERIALS AND ATOMS, ELSEVIER BV, NL, vol. 264, no. 2, 1 November 2007 (2007-11-01), pages 371 - 377, XP022339860, ISSN: 0168-583X, DOI: 10.1016/J.NIMB.2007.09.023
IHSAN ET AL: "Optimization of X-ray target parameters for a high-brightness microfocus X-ray tube", NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION B: BEAM INTERACTIONS WITH MATERIALS AND ATOMS, ELSEVIER BV, NL, vol. 264, no. 2, 1 November 2007 (2007-11-01), pages 371 - 377, XP022339860, ISSN: 0168-583X, DOI: 10.1016/J.NIMB.2007.09.023
Attorney, Agent or Firm:
DTS PATENT- UND RECHTSANWÄLTE SCHNEKENBÜHL UND PARTNER MBB (DE)
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