Title:
TRAY UNIT AND SEMICONDUCTOR DEVICE INSPECTING APPARATUS
Document Type and Number:
WIPO Patent Application WO/2012/014899
Kind Code:
A1
Abstract:
Provided is a tray unit, on which a plurality of semiconductor devices to be inspected can be mounted. The tray unit has a bottom plate member that forms the bottom portion, and a semiconductor device mounting tray, which is placed on the bottom plate member, and is divided into a plurality of sections in the horizontal direction, each of said sections mounting and holding a plurality of semiconductor devices. The tray unit is removably placed on a semiconductor device inspecting apparatus that tests in batch the electrical characteristics of the semiconductor devices by having the terminals provided in the semiconductor devices facing the upper surface side.
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Inventors:
MIYAKAWA Sueharu (425-4, MorimachiOita-city Oita, 27, 〒8700127, JP)
Application Number:
JP2011/066981
Publication Date:
February 02, 2012
Filing Date:
July 26, 2011
Export Citation:
Assignee:
Pleson LLC (425-4, MorimachiOita-city Oita, 27, 〒8700127, JP)
合同会社ＰＬＥＳＯＮ (〒27 大分県大分市森町４２５番地の４ Oita, 〒8700127, JP)
合同会社ＰＬＥＳＯＮ (〒27 大分県大分市森町４２５番地の４ Oita, 〒8700127, JP)
International Classes:
G01R31/26
Attorney, Agent or Firm:
OHATA Toshiro (Nippou Ikebukuro Daiichi Bldg. 4F-354-12, Ikebukuro 2-chom, Toshima-ku Tokyo 14, 〒1710014, JP)
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Claims: