Title:
TRUE DENSITY MEASUREMENT DEVICE
Document Type and Number:
WIPO Patent Application WO/2015/111651
Kind Code:
A1
Abstract:
This true density measurement device (10) is a device that is used to measure the true density of a sample (100) by a gas phase substitution method, and is provided with: a sample chamber (30) for accommodating the sample (100), the sample chamber (30) being pressurized through the introduction of an inert gas; and an expansion chamber (50) into which is released the inert gas filling the sample chamber (30). The expansion chamber (50), under conditions of normal use, is opened and closed by a detachable cover (42), and the volume thereof is modified by insertion or withdrawal of a volume modification member (55).
Inventors:
NAKAI KAZUYUKI (JP)
YAMAZAKI HIROMI (JP)
NAKAMURA KAORU (JP)
GOUMOTO TAKAYUKI (JP)
YAMAZAKI HIROMI (JP)
NAKAMURA KAORU (JP)
GOUMOTO TAKAYUKI (JP)
Application Number:
PCT/JP2015/051662
Publication Date:
July 30, 2015
Filing Date:
January 22, 2015
Export Citation:
Assignee:
MICROTRACBEL CORP (JP)
International Classes:
G01N9/26; G01N9/02
Foreign References:
| JP2011508230A | 2011-03-10 | |||
| DE102007025067A1 | 2007-12-06 | |||
| US4083228A | 1978-04-11 | |||
| US5074146A | 1991-12-24 | |||
| JP2009002824A | 2009-01-08 | |||
| JPH06307910A | 1994-11-04 | |||
| EP0720011A1 | 1996-07-03 | |||
| US5074146A | 1991-12-24 |
Other References:
See also references of EP 3098588A4
Attorney, Agent or Firm:
YKI Patent Attorneys (JP)
Patent business corporation YKI international patent firm (JP)
Patent business corporation YKI international patent firm (JP)
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