Title:
TWO-DIMENSIONAL FLICKER MEASUREMENT DEVICE, TWO-DIMENSIONAL FLICKER MEASUREMENT METHOD, AND TWO-DIMENSIONAL FLICKER MEASUREMENT PROGRAM
Document Type and Number:
WIPO Patent Application WO/2020/054209
Kind Code:
A1
Abstract:
This two-dimensional flicker measurement device is provided with: a two-dimensional imaging element; a calculation unit for calculating, on the basis of a photometric quantity obtained by imaging a device under test (DUT screen) by the two-dimensional imaging element, a flicker value of each of multiple measurement regions set on the device under test; and a correction part for correcting the flicker value of the each of the respective multiple measurement regions to an equivalent flicker value obtained when each of the multiple measurement regions is measured at a predetermined angle and direction.
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Inventors:
MURATA TOMOHIRO (JP)
MASUDA SATOSHI (JP)
MASUDA SATOSHI (JP)
Application Number:
PCT/JP2019/027847
Publication Date:
March 19, 2020
Filing Date:
July 16, 2019
Export Citation:
Assignee:
KONICA MINOLTA INC (JP)
International Classes:
H04N17/04; G01J1/44; G01M11/00; G09G3/20
Foreign References:
| JP2006091149A | 2006-04-06 | |||
| JP2005109535A | 2005-04-21 |
Attorney, Agent or Firm:
KOTANI, Etsuji et al. (JP)
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