Title:
TWO-DIMENSIONAL AND THREE-DIMENSIONAL MEASUREMENT METHOD FOR GAS TEMPERATURE DISTRIBUTION
Document Type and Number:
WIPO Patent Application WO/2015/060563
Kind Code:
A1
Abstract:
The present invention relates to a two-dimensional and three-dimensional measurement method for gas temperature distribution and is characterized by, using a diode laser, only one-dimensionally measuring and two-dimensionally or three-dimensionally mapping gas temperature and concentration distributions within a space for which a two-dimensional or three-dimensional measurement is impossible. Thereby, it is possible to easily two-dimensionally or three-dimensionally measure, without space constraint, gas temperature and concentration distributions even within a structure, such as a heating furnace of a steel mill, for which a two-dimensional or three-dimensional measurement is difficult.
Inventors:
LEE CHANG-YEOP (KR)
KIM SE-WON (KR)
KIM SE-WON (KR)
Application Number:
PCT/KR2014/009388
Publication Date:
April 30, 2015
Filing Date:
October 06, 2014
Export Citation:
Assignee:
KOREA IND TECH INST (KR)
International Classes:
G01K11/32; G01J5/10
Foreign References:
| KR20110078290A | 2011-07-07 | |||
| KR20130048873A | 2013-05-13 | |||
| KR101159215B1 | 2012-06-25 | |||
| JP2006337326A | 2006-12-14 |
Attorney, Agent or Firm:
LEE, Sang-Moon et al. (KR)
이상문 (KR)
이상문 (KR)
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