Title:
ULTRASONIC PROBE, ULTRASONIC DIAGNOSTIC DEVICE, AND METHOD FOR TESTING ULTRASONIC PROBES
Document Type and Number:
WIPO Patent Application WO/2016/152375
Kind Code:
A1
Abstract:
The purpose of the invention is to allow, without electrically contacting to a plurality of terminals connected to an oscillator, a test for screening for defects in an IC internal transceiver circuit to be carried out at low cost and without exceeding the breakdown voltage. A transmission-reception separating switch circuit that uses a transistor as a switching element prevents the gate-source breakdown voltage from being exceeded when a large amplitude signal is input by way of the gate potential during testing being lowered below same during reception and performs an internal signal loopback test without damaging a reception circuit.
Inventors:
KAJIYAMA SHINYA (JP)
IGARASHI YUTAKA (JP)
KATSUBE YUSAKU (JP)
NISHIMOTO TAKUMA (JP)
IGARASHI YUTAKA (JP)
KATSUBE YUSAKU (JP)
NISHIMOTO TAKUMA (JP)
Application Number:
PCT/JP2016/055706
Publication Date:
September 29, 2016
Filing Date:
February 25, 2016
Export Citation:
Assignee:
HITACHI LTD (JP)
International Classes:
A61B8/00
Foreign References:
| JP2013197929A | 2013-09-30 | |||
| JP2012209763A | 2012-10-25 | |||
| US20140084997A1 | 2014-03-27 |
Other References:
See also references of EP 3275374A4
Attorney, Agent or Firm:
SEIRYO I. P. C. (JP)
青稜 patent business corporation (JP)
青稜 patent business corporation (JP)
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