Title:
ULTRAVIOLET RADIATION INDEX MEASUREMENT DEVICE
Document Type and Number:
WIPO Patent Application WO/2015/026097
Kind Code:
A1
Abstract:
The present invention provides an ultraviolet radiation index measurement device and a method thereof. The method for measuring an ultraviolet radiation index comprises the steps of: preparing a first optical sensor having a spectral sensitivity only in a first section with a wavelength of 250nm-298nm, a second optical sensor having a spectral sensitivity only in a second section with a wavelength of 298nm-328nm, and a third optical sensor having a spectral sensitivity only in a third section with a wavelength of 328nm-400nm; correcting an output signal of the first optical sensor, an output signal of the second optical sensor, and an output signal of the third optical sensor by using a spectral irradiance of the standard light of the sun; measuring a first optical current of the first optical sensor, a second optical current of the second optical sensor, and a third optical current of the third optical sensor in a measurement environment; and calculating an ultraviolet radiation index by using the first optical current, the second optical current, and the third optical current in the measurement environment.
Inventors:
LEE DONG-HOON (KR)
PARK SEONGCHONG (KR)
SHIN DONG-JOO (KR)
PARK SEONGCHONG (KR)
SHIN DONG-JOO (KR)
Application Number:
PCT/KR2014/007523
Publication Date:
February 26, 2015
Filing Date:
August 13, 2014
Export Citation:
Assignee:
KOREA RES INST OF STANDARDS (KR)
International Classes:
G01J3/00
Foreign References:
| KR20050122775A | 2005-12-29 | |||
| JP2004317318A | 2004-11-11 | |||
| JP2005069843A | 2005-03-17 |
Attorney, Agent or Firm:
LEE, PYUNG-WOO (KR)
이평우 (KR)
이평우 (KR)
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