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Patent Searching and Data


Title:
VACUUM ELECTROSPRAY ION SOURCE AND MASS SPECTROMETER
Document Type and Number:
WIPO Patent Application WO/2018/188172
Kind Code:
A1
Abstract:
Disclosed are a vacuum electrospray ion source and a mass spectrometer, the vacuum electrospray ion source comprising a hollow capillary (1), a vacuum cavity (4), a gas inlet pipe, a gas-supply device and an adjustment device. A first end of the hollow capillary is a sampling port (8), a second end thereof is a nozzle (9) for vacuum electrospray and extends into the vacuum cavity, and the gas pressure in the vacuum cavity is in the range of 10-4 - 200 Pa. One end of the gas inlet pipe extends into the vacuum cavity, and the other end thereof is connected to the gas-supply device. The adjustment device is used for adjusting gas to intermittently flow through the gas inlet pipe. The ion source enables electrospray ionization in the vacuum environment. The vacuum cavity of the vacuum electrospray ion source is in communication with the vacuum cavity of the mass spectrometer to form the mass spectrometer, such that loss during the ion transmission process can be reduced, and the signal intensity and the limit of detection when detection is performed can be improved.

Inventors:
YU QUAN (CN)
ZHANG QIAN (CN)
WANG XIAOHAO (CN)
QIAN XIANG (CN)
NI KAI (CN)
Application Number:
PCT/CN2017/085721
Publication Date:
October 18, 2018
Filing Date:
May 24, 2017
Export Citation:
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Assignee:
GRADUATE SCHOOL SHENZHEN TSINGHUA UNIV (CN)
International Classes:
H01J49/16; H01J49/26
Foreign References:
CN103545166A2014-01-29
CN201975366U2011-09-14
CN106198707A2016-12-07
US9242258B22016-01-26
Attorney, Agent or Firm:
CHINA TRUER IP (CN)
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