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Title:
VARIABLE RESISTANCE ELEMENT, SEMICONDUCTOR DEVICE HAVING VARIABLE RESISTANCE ELEMENT, SEMICONDUCTOR DEVICE MANUFACTURING METHOD, AND PROGRAMMING METHOD USING VARIABLE RESISTANCE ELEMENT
Document Type and Number:
WIPO Patent Application WO/2013/136798
Kind Code:
A1
Abstract:
This variable resistance element is provided with a variable resistance film, a first electrode, which is disposed in contact with one surface of the variable resistance film, and a second electrode, which is disposed in contact with the other surface of the variable resistance film. The first and the second electrodes have corner portions, respectively, and the distance between the corner portions of the first and the second electrodes is set equal to the shortest distance between the first and the second electrodes. Furthermore, the variable resistance element has a third electrode, which is disposed on the one surface of the variable resistance film.

Inventors:
TADA, Munehiro (7-1Shiba 5-chome, Minato-k, Tokyo 01, 〒1088001, JP)
SAKAMOTO, Toshitsugu (7-1Shiba 5-chome, Minato-k, Tokyo 01, 〒1088001, JP)
MIYAMURA, Makoto (7-1Shiba 5-chome, Minato-k, Tokyo 01, 〒1088001, JP)
Application Number:
JP2013/001698
Publication Date:
September 19, 2013
Filing Date:
March 14, 2013
Export Citation:
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Assignee:
NEC CORPORATION (7-1Shiba 5-chome, Minato-ku Tokyo, 01, 〒1088001, JP)
TADA, Munehiro (7-1Shiba 5-chome, Minato-k, Tokyo 01, 〒1088001, JP)
SAKAMOTO, Toshitsugu (7-1Shiba 5-chome, Minato-k, Tokyo 01, 〒1088001, JP)
MIYAMURA, Makoto (7-1Shiba 5-chome, Minato-k, Tokyo 01, 〒1088001, JP)
International Classes:
H01L27/105; G11C13/00; H01L21/82; H01L45/00; H01L49/00
Domestic Patent References:
WO2011013255A12011-02-03
WO2011158821A12011-12-22
Foreign References:
JP2010199498A2010-09-09
JP2010062265A2010-03-18
JP2006120702A2006-05-11
Attorney, Agent or Firm:
SHIMOSAKA, Naoki (7-1Shiba 5-chome, Minato-k, Tokyo 01, 〒1088001, JP)
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