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Patent Searching and Data


Title:
VISIBLE PLANE DETERMINATION METHOD AND DEVICE, INVERSE RAY TRACING METHOD AND DEVICE
Document Type and Number:
WIPO Patent Application WO/2018/192419
Kind Code:
A1
Abstract:
The present disclosure provides a visible plane determination method and device and an inverse ray tracing method and device. The visible plane determination method comprises the steps of: acquiring plane information concerning planes to be determined in a target space; with regard to the first plane to be determined, detecting whether there exists one second plane to be determined such that all the line segments, formed by connecting plane bumps in the first plane to be determined to a signal transmission point, pass through the second plane to be determined, the first plane to be determined and the second plane to be determined being any two planes among the planes to be determined; determining, according to the detection result, whether the first plane to be determined is a visible plane; and performing the detection step and the determination step on the next plane to be determined until all the planes to be determined are traversed.

Inventors:
CHEN SHIJUN (CN)
DONG CHENGFENG (CN)
CHEN QIANG (CN)
WANG HUIQIANG (CN)
CHEN DAWEI (CN)
Application Number:
PCT/CN2018/082957
Publication Date:
October 25, 2018
Filing Date:
April 13, 2018
Export Citation:
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Assignee:
ZTE CORP (CN)
International Classes:
H04W40/20; H04B17/391
Foreign References:
CN105264566A2016-01-20
CN102621559A2012-08-01
US5051737A1991-09-24
US5577175A1996-11-19
Other References:
See also references of EP 3614584A4
Attorney, Agent or Firm:
TEE & HOWE INTELLECTUAL PROPERTY ATTORNEYS (CN)
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