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Patent Searching and Data


Title:
WAVELENGTH CHECKER
Document Type and Number:
WIPO Patent Application WO/2020/105472
Kind Code:
A1
Abstract:
This wavelength checker comprises an optical waveguide chip (101). A publicly-known array waveguide diffraction grating is formed on the optical waveguide chip (101). The waveguide checker further comprises a light conversion part (102) constituted of a conversion material that converts infrared light to visible light. The light conversion part (102) is disposed on an output side of a plurality of first output waveguides (107) of the optical waveguide chip (101) so as to be capable of receiving emitted light emitted by the plurality of first output waveguides (107). The light conversion part (102) is formed on a supporting part (109) on a lateral surface thereof that facesan output end face (108) of the optical waveguide chip (101). The supporting part (109) is fixed to a main substrate (151).

Inventors:
TANAKA TAKUYA (JP)
ISHIKAWA HIROSHI (JP)
SHIKAMA KOTA (JP)
Application Number:
JP2019/043838
Publication Date:
May 28, 2020
Filing Date:
November 08, 2019
Export Citation:
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Assignee:
NIPPON TELEGRAPH & TELEPHONE (JP)
International Classes:
G02B6/12; G01J1/58; G02B6/122; G02B6/30; G02B6/36; H04B10/07
Foreign References:
US20090016716A12009-01-15
JP2017194565A2017-10-26
JP2003218813A2003-07-31
JP2012093450A2012-05-17
Attorney, Agent or Firm:
YAMAKAWA, Shigeki et al. (JP)
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