Title:
WAVELENGTH MEASURING DEVICE, AND WAVELENGTH MEASURING METHOD
Document Type and Number:
WIPO Patent Application WO/2022/097726
Kind Code:
A1
Abstract:
This wavelength measuring device is provided with: a spectral diffraction means (3) for spectrally diffracting light emitted as a result of the excitation of a plurality of light-emitting element chips (101) included in a measurement target object (100); a light receiving means (5) having a plurality of pixels (51) for receiving the light that has been emitted from each light emitting surface of each light-emitting element chip and that has been spectrally diffracted, divided into a plurality of regions; a separating means (6) for separating measurement data obtained on the basis of the light reception results, for each light-emitting element chip (101); and a calculating means (6) for calculating a representative wavelength from the measurement data of each wavelength, in relation to the plurality of regions in the light emitting surfaces, for each separated light-emitting element chip (101).
Inventors:
KOSAKA AKIRA (JP)
HIRAO YUSUKE (JP)
HIRAO YUSUKE (JP)
Application Number:
PCT/JP2021/040846
Publication Date:
May 12, 2022
Filing Date:
November 05, 2021
Export Citation:
Assignee:
KONICA MINOLTA INC (JP)
International Classes:
G01J9/00; G01J3/443; H01L33/00
Domestic Patent References:
| WO2020195138A1 | 2020-10-01 |
Foreign References:
| EP3644045A1 | 2020-04-29 | |||
| CN109186946A | 2019-01-11 | |||
| US20200225151A1 | 2020-07-16 |
Attorney, Agent or Firm:
TAKATA Kenichi (JP)
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