WAVELENGTH SELECTIVE DETECTOR

Title:

WAVELENGTH SELECTIVE DETECTOR

Document Type and Number:

WIPO Patent Application WO2003103060

Kind Code:

A3

Abstract:

A wavelength selective detector having a first absorbing layer for absorbing light with a wavelength below a lower band cutoff, a second absorbing layer downstream of the first absorbing layer for absorbing light with a wavelength below an upper band cutoff, and a confinement layer situated between the first and second absorbing layers. The lower and upper band cutoffs can be set by controlling the bandgaps and/or thicknesses of the first and second absorbing layers. The wavelength selective detector of the present invention has a good out-of-band rejection, a narrow spectral responsivity, and a high in-band responsivity. In addition, the wavelength selective detector is relatively easy to manufacture using conventional integrated circuit fabrication techniques.

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Inventors:

GUENTER JAMES K
JOHNSON RALPH H

Application Number:

PCT/US2003/018205

Publication Date:

August 19, 2004

Filing Date:

June 03, 2003

Export Citation:

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Assignee:

FINISAR CORP (US)

International Classes:

H01L31/0328; H01L31/10; H01L31/101; (IPC1-7): H01L31/10; H01L31/101

Foreign References:

US6396117B1	2002-05-28
US20020005524A1	2002-01-17

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