Title:
WETTABILITY EVALUATION DEVICE AND METHOD
Document Type and Number:
WIPO Patent Application WO/2023/013221
Kind Code:
A1
Abstract:
The present invention addresses the problem of providing a method for evaluating wettability at a lower cost than existing methods. One preferred aspect of the present invention is a wettability evaluation device characterized by comprising: a flow path into which a first medium and a second medium are introduced; a measuring instrument for measuring the value of a current flowing through the flow path when the first medium and the second medium are introduced; and a control unit for evaluating the wettability of the inner wall surface of the flow path on the basis of the value of the current.
Inventors:
MATSUSHITA YUFUKU (JP)
KISHIOKA ATSUSHI (JP)
MIYAKE MASAFUMI (JP)
KISHIOKA ATSUSHI (JP)
MIYAKE MASAFUMI (JP)
Application Number:
PCT/JP2022/022017
Publication Date:
February 09, 2023
Filing Date:
May 30, 2022
Export Citation:
Assignee:
HITACHI HIGH TECH CORP (JP)
International Classes:
G01N27/02; G01N35/00; G01N35/08
Foreign References:
| US20210103070A1 | 2021-04-08 | |||
| US20170292902A1 | 2017-10-12 | |||
| US20150233810A1 | 2015-08-20 | |||
| US20080159073A1 | 2008-07-03 | |||
| US5121636A | 1992-06-16 | |||
| CN101311703A | 2008-11-26 |
Other References:
YOKOTA, HITOSHI ET AL.: "Estimation of Wettability between Metals and Hg by Interfacial Impedance Method", JOURNAL OF THE JAPAN INSTITUTE OF METALS AND MATERIALS, NIPPON KINZOKU GAKKAI, TOKYO., JP, vol. 57, no. 12, 1 January 1993 (1993-01-01), JP , pages 1445 - 1450, XP009543239, ISSN: 0021-4876
Attorney, Agent or Firm:
SEIRYO I.P.C. (JP)
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